Multipass lock-in thermography for the study ofoptical coating absorption

2022 ◽  
Author(s):  
Camille Petite ◽  
Rémi Marcouillé ◽  
Antonin MOREAU ◽  
Hélène KROL ◽  
Catherine GREZES-BESSET ◽  
...  
Keyword(s):  
2021 ◽  
Author(s):  
Camille Petite ◽  
Remi Marcouille ◽  
Antonin Moreau ◽  
Hélène Krol ◽  
Catherine Grezes-Besset ◽  
...  

1995 ◽  
Vol 7 (1) ◽  
pp. 215-228 ◽  
Author(s):  
J. Rantala ◽  
D. Wu ◽  
G. Busse
Keyword(s):  

1982 ◽  
Vol 43 (5) ◽  
pp. 755-759 ◽  
Author(s):  
M. Bertault ◽  
M. Krauzman ◽  
M. Le Postollec ◽  
R.M. Pick ◽  
M. Schott

2012 ◽  
Vol 132 (11) ◽  
pp. 1033-1038
Author(s):  
Yuichiro Kai ◽  
Yuji Tsuchida ◽  
Takashi Todaka ◽  
Masato Enokizono

GIS Business ◽  
2007 ◽  
Vol 2 (1) ◽  
pp. 39-47
Author(s):  
Sunita Kumari ◽  
Bino Paul G.D.

We explore emerging contexts of social entrepreneurship in India. Social entrepreneurship is emerging as an important option in poverty reduction and social change wherein organizing societal responses to scenarios like entrenched deprivation, cumulative disadvantages, long extant institutional lock-in, and vulnerabilities enmeshed in social stratification, hiatus emanating from segmentation of labour market and inadequate coverage of social protection form the core of strategies/collectives/organisation. In this paper, first, drawing cues from the literature, we outline basic typology of social entrepreneurship while delineating pivotal role technology and collaboration play in social entrepreneurship. Second, we provide a glimpse of not profit organisations in India, based on the secondary data. We juxtapose select patterns from the data on non profit organisations with human development. Third, we discuss select cases of social entrepreneurship that diverge in characteristics and contexts, in particular how these initiatives work towards poverty reduction and social development.


2016 ◽  
Vol 58 (1) ◽  
pp. 31-35
Author(s):  
Philipp Myrach ◽  
Christiane Maierhofer ◽  
Markus Rahammer ◽  
Marc Kreutzbruck
Keyword(s):  

2018 ◽  
Author(s):  
Ke-Ying Lin ◽  
Chih-Yi Tang ◽  
Yu Chi Wang

Abstract The paper demonstrates the moving of lock-in thermography (LIT) spot location by adjusting the lock-in frequency from low to high. Accurate defect localization in stacked-die devices was decided by the fixed LIT spot location after the lock-in frequency was higher than a specific value depending on the depth of the defect in the IC. Physical failure analysis was performed based on LIT results, which provided clear physical defect modes of the stacked-die devices.


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