Optical Lifetime Measurements Using a Positive Ion Van De Graaff Accelerator

1968 ◽  
Vol 7 (1) ◽  
pp. 167 ◽  
Author(s):  
L. L. Nichols ◽  
W. E. Wilson
Keyword(s):  
Lifetime Measurements ◽  
Graaff Accelerator ◽  
Van De Graaff ◽  
Positive Ion

Beam-foil lifetime measurements for Ga II and Ga III using a field-emission ion source

1985 ◽  
Vol 63 (10) ◽  
pp. 1330-1333 ◽  
Author(s):  
W. Ansbacher ◽  
E. H. Pinnington ◽  
J. L. Bahr ◽  
J. A. Kernahan
Keyword(s):  
Field Emission ◽  
Ion Source ◽  
Resonance Transition ◽  
Lifetime Measurements ◽  
Graaff Accelerator ◽  
Van De Graaff ◽  
Beam Foil ◽  
Foil Technique

A brief description is given of the modifications to a 2-MV Van de Graaff accelerator that are required to incorporate a field-emission ion source. The source is used to obtain a 1-μA beam of Ga+ ions. Lifetime measurements using the beam-foil technique are reported for the 4s5s1S, 4s4p1P, 4s4d1D, 4s5d1D, 4p21D, 4s5s3S, 4p23p, and 4s4d3D terms of Ga II and for the 5s2S, 4p2P, 4d2D, and 5f2F terms of Ga III. A detailed discussion is given of the cascading problem in the case of the Ga II resonance transition at 1414 Å.

Specimen Preparation of Near Surface Ion Irradiated Samples

1985 ◽  
Vol 43 ◽  
pp. 170-171
Author(s):  
K. F. Russell ◽  
L. L. Horton
Keyword(s):  
Radiation Damage ◽  
Heavy Ions ◽  
Target Material ◽  
Metal Alloys ◽  
Specimen Surface ◽  
Specimen Preparation ◽  
Particle Accelerators ◽  
Near Surface ◽  
Graaff Accelerator ◽  
Van De Graaff

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.

Microparticle acceleration by a Van de Graaff accelerator and application to space and material sciences

2001 ◽  
Vol 60 (4-5) ◽  
pp. 277-282 ◽  
Author(s):  
Hiromi Shibata ◽  
Koichi Kobayashi ◽  
Takeo Iwai ◽  
Yoshimi Hamabe ◽  
Sho Sasaki ◽  
...  
Keyword(s):  
Graaff Accelerator ◽  
Material Sciences ◽  
Van De Graaff

Restoration of the radio frequency ion source of the 5.5 MV CN-Van de Graaff accelerator at IFUNAM

2021 ◽  
Vol 16 (08) ◽  
pp. T08013
Author(s):  
C.G. Puigvert-Angulo ◽  
R. Espejel ◽  
C. Valencia ◽  
A.O. Valdez-Guerrero ◽  
J. Mas-Ruiz ◽  
...  
Keyword(s):  
Radio Frequency ◽  
Ion Source ◽  
Graaff Accelerator ◽  
Van De Graaff
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