scholarly journals Quantitative three-dimensional imaging of chemical short-range order via machine learning enhanced atom probe tomography

Author(s):  
Yue Li ◽  
Ye Wei ◽  
Zhangwei Wang ◽  
Timoteo Colnaghi ◽  
Liuliu Han ◽  
...  

Abstract Chemical short-range order (CSRO) refers to atoms of specific elements self-organising within a disordered crystalline matrix. These particular atomic neighbourhoods can modify the mechanical and functional performances of materials 1-6. CSRO is typically characterized indirectly, using volume-averaged (e.g. X-ray/neutron scattering) 2,7,8 or through projection (i.e. two-dimensional) microscopy techniques 5,6,9,10 that fail to capture the complex, three-dimensional atomistic architectures. Quantitative assessment of CSRO and concrete structure-property relationships remain unachievable. Here, we present a machine-learning enhanced approach to break the inherent resolution limits of atom probe tomography to reveal three-dimensional analytical imaging of the size and morphology of multiple CSRO. We showcase our approach by addressing a long-standing question encountered in a body-centred-cubic Fe-18Al (at.%) solid solution alloy that sees anomalous property changes upon heat treatment 2. After validating our method against artificial data for ground truth, we unearth non-statistical B2-CSRO (FeAl) instead of the generally-expected D03-CSRO (Fe3Al) 11,12. We propose quantitative correlations among annealing temperature, CSRO, and the nano-hardness and electrical resistivity, supported by atomistic simulations. The proposed strategy can be generally employed to investigate short/medium/long-range ordering phenomena in a vast array of materials and help design future high-performance materials.

2017 ◽  
Vol 118 (20) ◽  
Author(s):  
F. X. Zhang ◽  
Shijun Zhao ◽  
Ke Jin ◽  
H. Xue ◽  
G. Velisa ◽  
...  

1987 ◽  
Vol 48 (C6) ◽  
pp. C6-367-C6-372
Author(s):  
M. Yamamoto ◽  
S. Nenno ◽  
J. Tada ◽  
T. Fukuchi

1994 ◽  
Vol 08 (28) ◽  
pp. 1759-1769 ◽  
Author(s):  
M. Erbudak ◽  
M. Hochstrasser ◽  
E. Wetli

Secondary electron imaging (SEI) is presented as a new method which allows the investigation of the near surface structure in real time. SEI is based on the observation that electrons backscattered from surfaces in the keV range show a strong enhancement of intensity along directions defined by atomic rows. The spatial imaging of such electrons reveals the symmetry of near surface regions in real space. Three-dimensional views of the solid are readily obtained which makes this method ideally suited for the study of any material system where there is a change of symmetry. SEI is especially useful for the investigation of surfaces with short range order, such as those with submonolayer coverages of growing films, and of quasicrystals possessing only rotational long range order.


2011 ◽  
Vol 84 (6) ◽  
Author(s):  
Seng Fatt Liew ◽  
Jin-Kyu Yang ◽  
Heeso Noh ◽  
Carl F. Schreck ◽  
Eric R. Dufresne ◽  
...  

2012 ◽  
Vol 85 (21) ◽  
Author(s):  
Alexander A. Tsirlin ◽  
Artem M. Abakumov ◽  
Clemens Ritter ◽  
Paul F. Henry ◽  
Oleg Janson ◽  
...  

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