Morphometry of the embryo as an element of system testing quality of dill seeds

2018 ◽  
Vol 1 (72) ◽  
pp. 63-66 ◽  
Author(s):  
Aleksandr Bukharov ◽  
◽  
Dmitry Baleev ◽  
Maria Ivanova ◽  
Almira Bukharova ◽  
...  
Keyword(s):  
System Testing

scholarly journals A REVIEW ON MULTIMODAL SPEAKER RECOGNITION

2017 ◽  
Vol 10 (13) ◽  
pp. 382
Author(s):  
Khadar Nawas K
Keyword(s):  
Speaker Recognition ◽  
Microphone Array ◽  
Bone Conduction ◽  
Recognition System ◽  
Auditory Information ◽  
System Testing ◽  
Training Environment ◽  
Testing Environment

A review on multimodal speaker recognition (SR) is being presented. For many decades the speaker recognition has been studied and still it has grabbed the interest of many researchers. Speaker recognition includes of two levels –system training and system testing. The robustness of the speaker recognition system depends on the training environment and testing environment as well as  the quality of  speech .Air conducted (AC) Speech is a source from  which speaker is recognized by extracting the features. The performance of the speaker recognition system depends on AC speech. further to improve the robustness  and accuracy of  the SR system various other sources(Modals) like Throat Microphone ,Bone Conduction Microphone, array of microphones,Non Audible murmur, non auditory information like video are used in complementary with standard AC microphone. This paper is purely a review on SR and various complimentary modals.

scholarly journals Problems of Assessing the Quality of Education Using Test Certification Procedures

2019 ◽  
Vol 11 (2) ◽  
pp. 83-94
Author(s):  
A.V. Fokina
Keyword(s):  
Educational System ◽  
Educational Level ◽  
Educational Process ◽  
Quality Of Education ◽  
System Testing ◽  
High Stakes ◽  
The Real ◽  
High Stakes Tests ◽  
Final Exams

In the modern educational system testing has become one of the prevailing methods for assessing students' knowledge. The procedures for test certification of schoolchildren, especially the so-called “high-stakes tests,” which have a decisive influence on the trajectory of post-school education, are still debatable. In studies, the problem of misalignment of test indicators and the real educational level of the student is discussed, the presence of procedural and substantive shortcomings in the tests is stated. Article is devoted to the overview of the difficulties encountered by participants in the educational process in preparation for the exams. Such trends in final exams' critic as distrust to the exam procedure, procedural and content shortcomings, difficulties in preparing graduates for exams are discussed. It also describes the author's methodic of exam readiness diagnostic. It's based on the educational result’s esteem. The form of the methodic is given.

scholarly journals IMPLEMENTASI DYNAMIC PROGRAMMING PADA PENENTUAN JENIS MATERIAL UTAMA BANGUNAN ARENA FUTSAL

2015 ◽  
Vol 10 (1) ◽  
Author(s):  
Andree Anthony ◽  
R. Gunawan Santosa ◽  
Yuan Lukito
Keyword(s):  
Dynamic Programming ◽  
System Testing ◽  
Programming Techniques

Building futsal court need some planning, especially about the materials needed to build a futsal court such as synthetic grass, roofs, walls, benches, and some other materials. Each of materials have many choices usually based on quality and price. Thus it needs a system to assist on calculating the optimum materials combination based on a specified budget. Minimax Route method are used with dynamic programming techniques to maximize the quality of materials while minimizing the price of materials chosen. Based on system testing conducted to futsal court owners in Yogyakarta, the implementation are helpful and have many useful information for someone who want to build futsal court.

Immunoferritin localization of intracellular antigens in positively stained frozen sections

1978 ◽  
Vol 36 (2) ◽  
pp. 168-169
Author(s):  
K. T. Tokuyasu
Keyword(s):  
Surface Tension ◽  
Water Surface ◽  
Thin Layers ◽  
The Other ◽  
Positive Staining ◽  
Frozen Sections ◽  
The Past ◽  
Ultrathin Frozen Sections ◽  
Definition Of

During the past investigations of immunoferritin localization of intracellular antigens in ultrathin frozen sections, we found that the degree of negative staining required to delineate u1trastructural details was often too dense for the recognition of ferritin particles. The quality of positive staining of ultrathin frozen sections, on the other hand, has generally been far inferior to that attainable in conventional plastic embedded sections, particularly in the definition of membranes. As we discussed before, a main cause of this difficulty seemed to be the vulnerability of frozen sections to the damaging effects of air-water surface tension at the time of drying of the sections.Indeed, we found that the quality of positive staining is greatly improved when positively stained frozen sections are protected against the effects of surface tension by embedding them in thin layers of mechanically stable materials at the time of drying (unpublished).

Lithography below 100 nm

1983 ◽  
Vol 41 ◽  
pp. 96-99
Author(s):  
L. D. Jackel
Keyword(s):  
Spatial Distribution ◽  
Electron Beam ◽  
Electron Scattering ◽  
Electron Beam Lithography ◽  
Substrate Material ◽  
Local Electron ◽  
Electron Dose ◽  
Positive Resist ◽  
Exposure Process

Most production electron beam lithography systems can pattern minimum features a few tenths of a micron across. Linewidth in these systems is usually limited by the quality of the exposing beam and by electron scattering in the resist and substrate. By using a smaller spot along with exposure techniques that minimize scattering and its effects, laboratory e-beam lithography systems can now make features hundredths of a micron wide on standard substrate material. This talk will outline sane of these high- resolution e-beam lithography techniques.We first consider parameters of the exposure process that limit resolution in organic resists. For concreteness suppose that we have a “positive” resist in which exposing electrons break bonds in the resist molecules thus increasing the exposed resist's solubility in a developer. Ihe attainable resolution is obviously limited by the overall width of the exposing beam, but the spatial distribution of the beam intensity, the beam “profile” , also contributes to the resolution. Depending on the local electron dose, more or less resist bonds are broken resulting in slower or faster dissolution in the developer.

Convergent Beam Electron Diffraction

1978 ◽  
Vol 36 (3) ◽  
pp. 304-315
Author(s):  
G. Lehmpfuhl
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Crystal Surface ◽  
Diffraction Spot ◽  
Crystal Thickness ◽  
Large Area ◽  
Electron Microscopic ◽  
Additional Information ◽  
Microscopic Investigations

Introduction In electron microscopic investigations of crystalline specimens the direct observation of the electron diffraction pattern gives additional information about the specimen. The quality of this information depends on the quality of the crystals or the crystal area contributing to the diffraction pattern. By selected area diffraction in a conventional electron microscope, specimen areas as small as 1 µ in diameter can be investigated. It is well known that crystal areas of that size which must be thin enough (in the order of 1000 Å) for electron microscopic investigations are normally somewhat distorted by bending, or they are not homogeneous. Furthermore, the crystal surface is not well defined over such a large area. These are facts which cause reduction of information in the diffraction pattern. The intensity of a diffraction spot, for example, depends on the crystal thickness. If the thickness is not uniform over the investigated area, one observes an averaged intensity, so that the intensity distribution in the diffraction pattern cannot be used for an analysis unless additional information is available.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

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