Orthogonal Defect Classification-based Ontology Construction and Application of Software-hardware Integrated Error Pattern of Software-intensive Systems

Author(s):  
Xuan Hu ◽  
Jie Liu
2011 ◽  
Vol 10 ◽  
pp. 765-770 ◽  
Author(s):  
Li Zhi-bo ◽  
Hou Xue-mei ◽  
Yu Lei ◽  
Du Zhu-ping ◽  
Xu Bing

2012 ◽  
Vol 457-458 ◽  
pp. 488-494
Author(s):  
Qian Ran Si ◽  
Guo Ying Yan ◽  
Hui Ying Zhang

In this paper we discuss the fundamental principle of defect analysis, introduce the basic framework of Orthogonal Defect Classification(ODC), and summarize the principle and features of defect analysis based on ODC. Using software defect metric, defect baseline and inference rules to do software process analysis, we propose a novel defect analysis model based on ODC. Combined with practical projects, the principle of this model is discussed in details, and this model can improve the objectivity and effectiveness of defect analysis, which is favorable for the automated defect analysis.


10.29007/wtwg ◽  
2019 ◽  
Author(s):  
Osama Barack ◽  
Liguo Huang

As mobile applications have become popular among end-users, developers have intro- duced a wide range of features that increase the complexity of application code. Orthogonal Defect Classification (ODC) is a model that enables developers to classify defects and track the process of inspection and testing. However, ODC was introduced to classify defects of traditional software. Mobile applications differ from traditional applications in many ways; they are susceptible to external factors, such as screen and network changes, notifi- cations, and phone interruptions, which affect the applications’ functioning. Therefore, in this paper, the ODC model will be adapted to accommodate defects of mobile applications. This allows us to address newly introduced application defects found in the mobile domain, such as energy, notification, and Graphical User Interface (GUI). In addition, based on the new model, we classify found defects of two well-known mobile applications. Moreover, we discuss one-way and two-way analyses. This work provides developers with a suitable defect analysis technique for mobile applications.


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