scholarly journals Breeding Winter Oat (Avena sativa L.) Varieties with High Quality

2021 ◽  
Vol 8 (4) ◽  
pp. 1187-1197
Author(s):  
Yüksel KAYA ◽  
Mevlüt AKÇURA
Keyword(s):  
Avena Sativa ◽  
High Quality

Oat quality and yield as affected by kernel moisture at swathing

2005 ◽  
Vol 85 (4) ◽  
pp. 839-846 ◽  
Author(s):  
William E. May ◽  
Ramona M. Mohr ◽  
Guy P. Lafond ◽  
F. Craig Stevenson
Keyword(s):  
Moisture Content ◽  
Protein Content ◽  
Key Words ◽  
Avena Sativa ◽  
Oil Content ◽  
Seed Quality ◽  
Kernel Weight ◽  
Test Weight ◽  
High Quality ◽  
Yield And Quality

Increased demand for high-quality oat has rekindled interest in improving oat (Avena sativa L.) yield and quality by managing the timing of oat swathing. The objective of this study was to determine the effect of swathing at five levels of kernel moisture on yield and seed quality at Indian Head, SK, and Brandon, MB, from 1997 (Indian Head only) to 2000. The largest benefit to yield and quality was achieved when swathing was delayed from 50 to 41% kernel moisture. Kernel weight, plump seed and groat yield were optimized when kernel moisture was between 36 and 30% moisture content. Dockage, protein content and oil content also improved with later swathing dates. Swathing should not begin until a kernel moisture content of 41% has been reached. After 30% kernel moisture was reached, no improvement in oat yield and quality occurred when swathing was delayed any further. Key words: Avena sativa L., test weight, thin seed, groat yield, protein, germination

Effects of relative time of emergence and density of wild oat (Avena fatua L.) on oat quality

2005 ◽  
Vol 85 (3) ◽  
pp. 561-567 ◽  
Author(s):  
C. J. Willenborg ◽  
B. G. Rossnagel ◽  
W. E. May ◽  
G. P. Lafond ◽  
S. J. Shirtliffe
Keyword(s):  
Key Words ◽  
Avena Sativa ◽  
Grain Quality ◽  
Field Experiments ◽  
Kernel Weight ◽  
Avena Fatua ◽  
Wild Oat ◽  
Kernel Size ◽  
High Quality ◽  
Relative Time

Selective control of wild oat with herbicides is not possible in oat (Avena sativa L.) crops and, consequently, the high quality that is imperative to market success is continually jeopardized. Field experiments were conducted to determine the effects of relative time of emergence and density of wild oat on oat kernel size and weight. Thousand-kernel weight and percentage plump kernels were generally reduced, and percentage thin kernels were generally increased with increasing wild oat densities and earlier wild oat emergence. However, reductions were generally small and occurred only at the highest wild oat densities, which are not commonly observed in commercial fields. These findings suggest that oat growers should not control wild oat based on perceived reductions in oat physical grain quality. Key words: Competition, emergence, physical grain quality, test weight, 1000-kernel weight

scholarly journals Nutritional composition of pre-dried silage of different winter cereals

2018 ◽  
Vol 40 (1) ◽  
pp. 42500
Author(s):  
Egon Henrique Horst ◽  
Mikael Neumann ◽  
Juliana Mareze ◽  
Guilherme Fernando Mattos Leão ◽  
Valter Harry Bumbieris Junior ◽  
...  
Keyword(s):  
Triticum Aestivum ◽  
Chemical Composition ◽  
Avena Sativa ◽  
Nutritional Composition ◽  
The Other ◽  
Chemical Characteristics ◽  
Lower Content ◽  
High Quality ◽  
Winter Cereals ◽  
Avena Strigosa

 This study aimed to assess the chemical composition of the forage and pre-dried silage from twelve winter cereals harvested at pre-flowering. We used black oat (Avena strigosa) cv. EMB 139 and cv. IAPAR 61; white oat (Avena sativa) cv. IPR and 126 hp. URS Taura; barley (Hordeum vulgare) cv. BRS Brau and cv. BRS Cauê; wheat (Triticum aestivum) cv. BRS Umbu and cv. BRS Tarumã; rye (Secale cereale) cv. Temprano and cv. BRS Serrano; and triticale (X. Triticosecale) cv. IPR and 111 hp. BRS Saturno. Plants were harvested at pre-flowering, when they were pre-dried and ensiled. The analysis of variance evidenced nutritional differences between species and cultivars. Triticale cv. IPR 111 showed notorious chemical characteristics in relation to the other treatments, highest protein content (113.7 g kg-1) and lower content of NDF and ADF (657.9 and 380.9 g kg-1, respectively). Among the pre-dried silages, barley cv. BRS Cauê had the highest level of NDT (614.7 g kg-1). Triticale cv. IPR 111 was shown as a high-quality nutritional food as forage and kept these characteristics after conservation. On the other hand, the pre-dried silage of barley cv. BRS Cauê showed the highest potential for nutrient degradability. 

Some problems of objective-prism spectra classification

1966 ◽  
Vol 24 ◽  
pp. 51-52
Author(s):  
E. K. Kharadze ◽  
R. A. Bartaya
Keyword(s):  
Short Wave ◽  
High Quality ◽  
Stellar Spectra ◽  
Objective Prism

The unique 70-cm meniscus-type telescope of the Abastumani Astrophysical Observatory supplied with two objective prisms and the seeing conditions characteristic at Mount Kanobili (Abastumani) permit us to obtain stellar spectra of a high quality. No additional design to improve the “climate” immediately around the telescope itself is being applied. The dispersions and photographic magnitude limits are 160 and 660Å/mm, and 12–13, respectively. The short-wave end of spectra reaches 3500–3400Å.

SEM Cold Stage Techniques for the Observation of Vegetative and Floral Apices of Oat (Avena sativa L.) Plants

1977 ◽  
Vol 35 ◽  
pp. 590-591
Author(s):  
B. K. Kirchoff ◽  
L.F. Allard ◽  
W.C. Bigelow
Keyword(s):  
Critical Point ◽  
Avena Sativa ◽  
Substantial Improvement ◽  
Fresh Tissue ◽  
Cold Stage ◽  
Critical Point Drying ◽  
Almost All ◽  
Cell Collapse ◽  
Conductive Paint ◽  
Carbon Based

In attempting to use the SEM to investigate the transition from the vegetative to the floral state in oat (Avena sativa L.) it was discovered that the procedures of fixation and critical point drying (CPD), and fresh tissue examination of the specimens gave unsatisfactory results. In most cases, by using these techniques, cells of the tissue were collapsed or otherwise visibly distorted. Figure 1 shows the results of fixation with 4.5% formaldehyde-gluteraldehyde followed by CPD. Almost all cellular detail has been obscured by the resulting shrinkage distortions. The larger cracks seen on the left of the picture may be due to dissection damage, rather than CPD. The results of observation of fresh tissue are seen in Fig. 2. Although there is a substantial improvement over CPD, some cell collapse still occurs.Due to these difficulties, it was decided to experiment with cold stage techniques. The specimens to be observed were dissected out and attached to the sample stub using a carbon based conductive paint in acetone.

A non-cyanide method of electropolishing silver

1978 ◽  
Vol 36 (1) ◽  
pp. 146-147
Author(s):  
R. L. Lyles ◽  
S. J. Rothman ◽  
W. Jäger
Keyword(s):  
Electron Microscopy ◽  
Sulphuric Acid ◽  
Methyl Alcohol ◽  
Health Hazards ◽  
Silver Alloy ◽  
High Quality ◽  
Silver Alloys ◽  
Free Sample ◽  
Specimen Quality ◽  
Standard Techniques

Standard techniques of electropolishing silver and silver alloys for electron microscopy in most instances have relied on various CN recipes. These methods have been characteristically unsatisfactory due to difficulties in obtaining large electron transparent areas, reproducible results, adequate solution lifetimes, and contamination free sample surfaces. In addition, there are the inherent health hazards associated with the use of CN solutions. Various attempts to develop noncyanic methods of electropolishing specimens for electron microscopy have not been successful in that the specimen quality problems encountered with the CN solutions have also existed in the previously proposed non-cyanic methods.The technique we describe allows us to jet polish high quality silver and silver alloy microscope specimens with consistant reproducibility and without the use of CN salts.The solution is similar to that suggested by Myschoyaev et al. It consists, in order of mixing, 115ml glacial actic acid (CH3CO2H, specific wt 1.04 g/ml), 43ml sulphuric acid (H2SO4, specific wt. g/ml), 350 ml anhydrous methyl alcohol, and 77 g thiourea (NH2CSNH2).

A High Resolution Scanning Microscope

1968 ◽  
Vol 26 ◽  
pp. 356-357
Author(s):  
A. V. Crewe ◽  
J. Wall ◽  
L. M. Welter
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Spherical Aberration ◽  
Focal Length ◽  
Spot Size ◽  
Emission Source ◽  
Field Of View ◽  
Scanning Microscope ◽  
Magnetic Lens ◽  
High Quality

A scanning microscope using a field emission source has been described elsewhere. This microscope has now been improved by replacing the single magnetic lens with a high quality lens of the type described by Ruska. This lens has a focal length of 1 mm and a spherical aberration coefficient of 0.5 mm. The final spot size, and therefore the microscope resolution, is limited by the aberration of this lens to about 6 Å.The lens has been constructed very carefully, maintaining a tolerance of + 1 μ on all critical surfaces. The gun is prealigned on the lens to form a compact unit. The only mechanical adjustments are those which control the specimen and the tip positions. The microscope can be used in two modes. With the lens off and the gun focused on the specimen, the resolution is 250 Å over an undistorted field of view of 2 mm. With the lens on,the resolution is 20 Å or better over a field of view of 40 microns. The magnification can be accurately varied by attenuating the raster current.

Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

1995 ◽  
Vol 53 ◽  
pp. 512-513
Author(s):  
L. Mulestagno ◽  
J.C. Holzer ◽  
P. Fraundorf
Keyword(s):  
Sample Preparation ◽  
Milling Time ◽  
High Density ◽  
Low Density ◽  
Ion Milling ◽  
High Quality ◽  
Variable Angle ◽  
Major Disadvantage ◽  
Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

Structural changes in silicon-on-insulator material during post-implantation annealing

1986 ◽  
Vol 44 ◽  
pp. 736-737
Author(s):  
C. O. Jung ◽  
S. J. Krause ◽  
S.R. Wilson
Keyword(s):  
Integrated Circuits ◽  
Oxide Layer ◽  
High Speed ◽  
Structural Changes ◽  
Device Fabrication ◽  
Silicon On Insulator ◽  
High Quality ◽  
Radiation Hardened ◽  
Post Implantation ◽  
Very High

Silicon-on-insulator (SOI) structures have excellent potential for future use in radiation hardened and high speed integrated circuits. For device fabrication in SOI material a high quality superficial Si layer above a buried oxide layer is required. Recently, Celler et al. reported that post-implantation annealing of oxygen implanted SOI at very high temperatures would eliminate virtually all defects and precipiates in the superficial Si layer. In this work we are reporting on the effect of three different post implantation annealing cycles on the structure of oxygen implanted SOI samples which were implanted under the same conditions.

Performance and applications of a field-emission gun TEM/STEM

1992 ◽  
Vol 50 (2) ◽  
pp. 942-943
Author(s):  
Judith M. Brock ◽  
Max T. Otten ◽  
Marc. J.C. de Jong
Keyword(s):  
Field Emission ◽  
High Resolution Imaging ◽  
High Quality ◽  
Small Energy ◽  
High Brightness ◽  
Small Probe ◽  
Resolution Imaging ◽  
Convergent Beam ◽  
Beam Patterns ◽  
Beam Diffraction

A Field Emission Gun (FEG) on a TEM/STEM instrument provides a major improvement in performance relative to one equipped with a LaB6 emitter. The improvement is particularly notable for small-probe techniques: EDX and EELS microanalysis, convergent beam diffraction and scanning. The high brightness of the FEG (108 to 109 A/cm2srad), compared with that of LaB6 (∼106), makes it possible to achieve high probe currents (∼1 nA) in probes of about 1 nm, whilst the currents for similar probes with LaB6 are about 100 to 500x lower. Accordingly the small, high-intensity FEG probes make it possible, e.g., to analyse precipitates and monolayer amounts of segregation on grain boundaries in metals or ceramics (Fig. 1); obtain high-quality convergent beam patterns from heavily dislocated materials; reliably detect 1 nm immuno-gold labels in biological specimens; and perform EDX mapping at nm-scale resolution even in difficult specimens like biological tissue.The high brightness and small energy spread of the FEG also bring an advantage in high-resolution imaging by significantly improving both spatial and temporal coherence.

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