scholarly journals Monomode Optical Waveguide Achieved by Lattice Damage in Yttria-Stabilized Zirconia Crystal Induced from Energetic Oxygen Irradiation

2021 ◽  
Vol 11 (22) ◽  
pp. 10750
Author(s):  
Xianbing Ming ◽  
Zekun Wang ◽  
Yi Zhang
Keyword(s):  
Surface Region ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Near Surface ◽  
Zirconia Crystal ◽  
Oxygen Ions ◽  
Lattice Damage ◽  
Optical Applications ◽  
Good Agreement

With valuable physicochemical properties, yttria-stabilized zirconia crystal has promising advantages in optical applications. In this paper, the waveguide effect is observed in yttria-stabilized zirconia crystal irradiated by energetic oxygen ions. The waveguide properties and the field intensity are analyzed using prism and end-face coupling method arrangements, and the results show that monomode is found in the near-surface region and the light beam can be well confined in the waveguide structure, which shows refractive index distribution of the barrier-wall and enhanced-well type. The lattice damage induced by irradiation is investigated by the Rutherford backscattering/channeling experiment and high-resolution X-ray diffraction techniques. The simulation results are in good agreement with the experimental data.

Characterizations of Synthetic 8mol% YSZ with Comparison to 3mol %YSZ for HT-SOFC

2020 ◽  
Vol 38 (4A) ◽  
pp. 491-500
Author(s):  
Abeer F. Al-Attar ◽  
Saad B. H. Farid ◽  
Fadhil A. Hashim
Keyword(s):  
Ionic Conductivity ◽  
Electrochemical Impedance ◽  
Structural Information ◽  
Impedance Analysis ◽  
High Energy ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Powder Morphology ◽  
X Ray

In this work, Yttria (Y2O3) was successfully doped into tetragonal 3mol% yttria stabilized Zirconia (3YSZ) by high energy-mechanical milling to synthesize 8mol% yttria stabilized Zirconia (8YSZ) used as an electrolyte for high temperature solid oxide fuel cells (HT-SOFC). This work aims to evaluate the densification and ionic conductivity of the sintered electrolytes at 1650°C. The bulk density was measured according to ASTM C373-17. The powder morphology and the microstructure of the sintered electrolytes were analyzed via Field Emission Scanning Electron Microscopy (FESEM). The chemical analysis was obtained with Energy-dispersive X-ray spectroscopy (EDS). Also, X-ray diffraction (XRD) was used to obtain structural information of the starting materials and the sintered electrolytes. The ionic conductivity was obtained through electrochemical impedance spectroscopy (EIS) in the air as a function of temperatures at a frequency range of 100(mHz)-100(kHz). It is found that the 3YSZ has a higher density than the 8YSZ. The impedance analysis showed that the ionic conductivity of the prepared 8YSZ at 800°C is0.906 (S.cm) and it was 0.214(S.cm) of the 3YSZ. Besides, 8YSZ has a lower activation energy 0.774(eV) than that of the 3YSZ 0.901(eV). Thus, the prepared 8YSZ can be nominated as an electrolyte for the HT-SOFC.

Effect of Yttria-Stabilized Zirconia Concentration in an Electroless Bath on Microstructure and Composition of Ni/Yttria-Stabilized Zirconia Nanocomposite

2021 ◽  
Vol 21 (11) ◽  
pp. 5592-5602
Author(s):  
Samira Almasi ◽  
Ali Mohammad Rashidi
Keyword(s):  
High Performance ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Nickel Ion ◽  
Nanocomposite Particles ◽  
X Ray ◽  
Ni Content ◽  
Naoh Solution ◽  
Average Size

The effect of the yttria-stabilized zirconia (YSZ) nanoparticle loading in an electro-less bath was considered as one of the vital synthesis variables for control Ni content and microstructure of prepared nanocomposite particles, which are two crucial factors to achieving high-performance SOFC anode. Nanocomposite particles were prepared using a simple electroless method without any expensive pretreatment of sensitizing by Sn2+ ions as well as activating by Pd2+ ions that are usually used to apply nickel coating on the surface of a non-conductive substrate. The process was performed by adding YSZ nanoparticles into NaOH solution, separating them from the solution by the centrifugal method, then providing several water-based nanofluids with different concentrations of activated YSZ nanoparticles, mixing them with NiCI2 solution, followed by adding the hydrazine and then NaOH solution. X-ray diffraction and scanning electron microscopy coupled with energy dispersive X-ray analysis were used to analyze the prepared nanocomposite particles. It is observed that after adding YSZ nanoparticles into the NaOH solution, the pH of the solution varied gradually from a starting pH of 10.2 to 9. Also, by increasing the YSZ nanoparticles loading in the electroless bath from 76 mg/l to 126 mg/l, the grain size of Ni deposits, the Ni content and the average size of the prepared nanocomposite particles decreased. The electrochemical mechanism previously proposed for the nickel ion reduction was modified, and a novel analytical model was proposed for variation of the efficiency of Ni deposition with YSZ nanoparticles loading.

EPITAXIAL GROWTH OF YTTRIA-STABILIZED ZIRCONIA FILMS ON SILICON BY R.F. MAGNETRON SPUTTERING

1991 ◽  
Vol 05 (27) ◽  
pp. 1829-1835 ◽  
Author(s):  
Q.X. SU ◽  
L. LI ◽  
Y.Y. ZHAO ◽  
Y.Z. ZHANG ◽  
P. XU
Keyword(s):  
Magnetron Sputtering ◽  
Yttria Stabilized Zirconia ◽  
Processing Conditions ◽  
Full Width ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Si Substrates ◽  
Zirconia Films ◽  
Scanning Electron

Yttria-stabilized Zirconia(YSZ) films were deposited on (100)Si substrates by R.F. magnetron sputtering method. X-ray diffraction analysis showed that the best YSZ films were cubic in structure and was grown epitaxially with (100) orientation. The (200) peak of YSZ films was 0.8° of the full width at half of the maximum, X-ray diffraction based on Seemann-Bohlin focusing geometry showed no peaks. The morphology of the YSZ films was observed by scanning electron microscopy. The effects of the processing conditions (such as substrate temperature, oxygen partial pressure, etc.) on the structure of the film were also discussed.

scholarly journals Identification of tetragonal and cubic structures of zirconia using synchrotron x-radiation source

1991 ◽  
Vol 6 (6) ◽  
pp. 1287-1292 ◽  
Author(s):  
Ram Srinivasan ◽  
Robert J. De Angelis ◽  
Gene Ice ◽  
Burtron H. Davis
Keyword(s):  
Particle Size ◽  
Radiation Source ◽  
Sol Gel ◽  
Yttria Stabilized Zirconia ◽  
Tetragonal Structure ◽  
Cubic Phase ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Synchrotron Source ◽  
Three Samples

X-ray diffraction from a synchrotron source was employed in an attempt to identify the crystal structures in zirconia ceramics produced by the sol-gel method. The particles of chemically precipitated zirconia, after calcination below 600 °C, are very fine, and have a diffracting particle size in the range of 7–15 nm. As the tetragonal and cubic structures of zirconia have similar lattice parameters, it is difficult to distinguish between the two. The tetragonal structure can be identified only by the characteristic splittings of the Bragg profiles from the “c” index planes. However, these split Bragg peaks from the tetragonal phase in zirconia overlap with one another due to particle size broadening. In order to distinguish between the tetragonal and cubic structures of zirconia, three samples were studied using synchrotron radiation source. The results indicated that a sample containing 13 mol% yttria-stabilized zirconia possessed the cubic structure with a0 = 0.51420 ± 0.00012 nm. A sample containing 6.5 mol% yttria stabilized zirconia was found to consist of a cubic phase with a0 = 0.51430 ± 0.00008 nm. Finally, a sample which was precipitated from a pH 13.5 solution was observed to have the tetragonal structure with a0 = 0.51441 ± 0.00085 nm and c0 = 0.51902 ± 0.00086.

Sinterability of 8 mol% Yttria Stabilized Zirconia

2018 ◽  
Vol 280 ◽  
pp. 102-108
Author(s):  
Tinesha Selvaraj ◽  
Johar Banjuraizah ◽  
S.F. Khor ◽  
M.N. Mohd Zainol
Keyword(s):  
Low Cost ◽  
Crystal Structure Analysis ◽  
Yttria Stabilized Zirconia ◽  
Holding Time ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Holding Period ◽  
Particle Size And Morphology ◽  
Size And Morphology ◽  
Sintering Behaviour

The sintering behaviour of low cost 8 mol% yttria stabilized zirconia powders has been studied. The effect of sintering holding time of the sintered granulated and milled 8YSZ were determined using density measurements, scanning electron microscopy (SEM) and X-ray diffraction (XRD). The elemental composition, particle size and morphology of the as-received 8YSZ powder and proceed for milling was investigated. 48 hours of ball milling on granulated 8YSZ resulted rises in specific surface area and sintered at 1550°C with the various period of time (4, 5, 6 and 7 hours). The milled 8YSZ sample with 5h sintering holding period coded as F5, sintering activity improved and the relative density came up to 98.3%. But then, granulated 8YSZ achieved only 62.7% with 5 hours holding time. Crystal structure analysis for milled 8YSZ powder consists of 59.6% of cubic ZrO2 phase, 40.1% of tetragonal ZrO2 and 0.3% of monoclinic ZrO2. Meanwhile, granulated 8YSZ indicated low content in cubic ZrO2 but high amount in monoclinic ZrO2 phase. In brief, low cost 8YSZ reached higher densification of 98% successfully.

Thermal Cycling Effect on Mechanical Properties of Yttria-Stabilized Tetragonal Zirconia

2013 ◽  
Vol 538 ◽  
pp. 121-124
Author(s):  
Jing Zhang
Keyword(s):  
Mechanical Properties ◽  
Phase Transition ◽  
Thermal Expansion ◽  
Flexural Strength ◽  
Thermal Cycling ◽  
Tetragonal Zirconia ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Optical Applications ◽  
The Stability

Yttria-stabilized zirconia (YSZ) is an important material in the area of energy and optical applications. In this study, the mechanical properties (Young’s modulus, Vickers hardness, flexural strength, and coefficient thermal expansion) and physical properties (phase transition) of yttria-stabilized tetragonal zirconia polycrystalline (Y-TZP) was reported. The effect of thermal cycling on the mechanical properties and the stability was also evaluated.

Synchrotron radiation study of yttria-stabilized zirconia, Zr0.758Y0.242O1.879

1999 ◽  
Vol 55 (5) ◽  
pp. 726-735 ◽  
Author(s):  
N. Ishizawa ◽  
Y. Matsushima ◽  
M. Hayashi ◽  
M. Ueki
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Yttria Stabilized Zirconia ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Ideal Position ◽  
Fluorite Type ◽  
The Ideal

The fluorite-related cubic structure of yttria-stabilized zirconia, Zr0.75 8Y0.24 2O1.87 9, has been studied by single-crystal X-ray diffraction using synchrotron radiation and by EXAFS. Two diffraction data sets obtained at X-ray energies of 512 and 10 eV below the Y K edge revealed that in the average structure Zr atoms are displaced from the origin of the space group Fm3¯m along 〈111〉 by 0.19 Å, while Y atoms reside at the origin. Approximately 48% of the O atoms occupy the ideal position in the fluorite-type structure, while 43% of O atoms are displaced from the ideal position along 〈001〉 by 0.31 Å. The remaining 9% of O atoms are presumably sited at interstitial positions. Local structures around Zr and Y are investigated by combining the results of single-crystal X-ray diffraction and EXAFS studies.

Short-range ordering of Cu3Au above Tc in the topmost 80 A of a (001) face

1997 ◽  
Vol 12 (1) ◽  
pp. 75-82 ◽  
Author(s):  
M. Kimura ◽  
J. B. Cohen ◽  
S. Chandavarkar ◽  
K. Liang
Keyword(s):  
Short Range ◽  
Short Range Order ◽  
Surface Region ◽  
Antiphase Domain ◽  
Range Order ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Diffuse Intensity ◽  
Near Surface ◽  
Atomic Displacements

The short-range order in the near surface region of the Cu3Au(001) face was investigated above the critical temperature by glancing-incidence x-ray diffraction, measuring the diffuse intensity throughout a two-dimensional region of reciprocal space. This intensity was analyzed quantitatively to obtain the two-dimensional Cowley–Warren short-range-order parameters and atomic displacements. Monte-Carlo simulation based on these values has revealed that the atomic configurations in the surface consist of ordered domains and clusters in a disordered matrix. There is a large number of {10} antiphase domain boundaries (APDB).

Fabrication of Porous YSZ from ZnO-YSZ Cermet

2007 ◽  
Vol 124-126 ◽  
pp. 235-238
Author(s):  
Moon Jin Hwang ◽  
Chong Soo Han
Keyword(s):  
Electron Microscope ◽  
Gas Permeability ◽  
Acid Leaching ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Scanning Electron Microscope Image ◽  
X Ray ◽  
Electron Microscope Image ◽  
Scanning Electron

Porous YSZ(8 mol% yttria-stabilized zirconia) was prepared by an acid leaching of ZnO-YSZ composite. The ZnO-YSZ composites were obtained by two different methods, a 1450 °C sintering of the mechanical mixture of ZnO and YSZ powders or a decomposition of Zn(NO3)2 deposited on YSZ and a subsequent sintering. The XRD (X-ray diffraction) pattern of the composite indicated that it was a mixture of ZnO and YSZ even after the sintering. Sharp edge or round edge of YSZ was observed in SEM (Scanning Electron Microscope) image of the porous-YSZ from the mixture of ZnO and YSZ, or Zn(NO3)2 deposited on YSZ, respectively. The porous YSZ from the composite having ZnO component greater than 60 wt% shows low mechanical strength. As the ZnO content of the composite increased, the porosity and gas permeability of the porous YSZ increased. From the result, it was suggested that ZnO is a candidate to generate pores in YSZ bulk or membrane.

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