scholarly journals Reducing Threading Dislocations of Single-Crystal Diamond via In Situ Tungsten Incorporation

Materials ◽  
2022 ◽  
Vol 15 (2) ◽  
pp. 444
Author(s):  
Ruozheng Wang ◽  
Fang Lin ◽  
Gang Niu ◽  
Jianing Su ◽  
Xiuliang Yan ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
Crystal Quality ◽  
Diamond Growth ◽  
Sem Images ◽  
High Pressure High Temperature ◽  
Diamond Substrate ◽  
Single Crystal Diamond

A lower dislocation density substrate is essential for realizing high performance in single-crystal diamond electronic devices. The in-situ tungsten-incorporated homoepitaxial diamond by introducing tungsten hexacarbonyl has been proposed. A 3 × 3 × 0.5 mm3 high-pressure, high-temperature (001) diamond substrate was cut into four pieces with controlled experiments. The deposition of tungsten-incorporated diamond changed the atomic arrangement of the original diamond defects so that the propagation of internal dislocations could be inhibited. The SEM images showed that the etching pits density was significantly decreased from 2.8 × 105 cm−2 to 2.5 × 103 cm−2. The reduction of XRD and Raman spectroscopy FWHM proved that the double-layer tungsten-incorporated diamond has a significant effect on improving the crystal quality of diamond bulk. These results show the evident impact of in situ tungsten-incorporated growth on improving crystal quality and inhibiting the dislocations propagation of homoepitaxial diamond, which is of importance for high-quality diamond growth.

scholarly journals Surface Morphology and Microstructure Evolution of Single Crystal Diamond during Different Homoepitaxial Growth Stages

Materials ◽  
2021 ◽  
Vol 14 (20) ◽  
pp. 5964
Author(s):  
Guoqing Shao ◽  
Juan Wang ◽  
Shumiao Zhang ◽  
Yanfeng Wang ◽  
Wei Wang ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Single Crystal ◽  
Cross Section ◽  
Growth Model ◽  
Diamond Growth ◽  
Step Flow ◽  
Homoepitaxial Growth ◽  
Diamond Substrate ◽  
Single Crystal Diamond ◽  
Step Flow Growth

Homoepitaxial growth of step-flow single crystal diamond was performed by microwave plasma chemical vapor deposition system on high-pressure high-temperature diamond substrate. A coarse surface morphology with isolated particles was firstly deposited on diamond substrate as an interlayer under hillock growth model. Then, the growth model was changed to step-flow growth model for growing step-flow single crystal diamond layer on this hillock interlayer. Furthermore, the surface morphology evolution, cross-section and surface microstructure, and crystal quality of grown diamond were evaluated by scanning electron microscopy, high-resolution transmission electron microcopy, and Raman and photoluminescence spectroscopy. It was found that the surface morphology varied with deposition time under step-flow growth parameters. The cross-section topography exhibited obvious inhomogeneity in crystal structure. Additionally, the diamond growth mechanism from the microscopic point of view was revealed to illustrate the morphological and structural evolution.

Single Crystal CVD Diamond growth and characterizations

2006 ◽  
Vol 956 ◽  
Author(s):  
Nicolas Olivier Tranchant ◽  
Dominique Tromson ◽  
Zdenek Remes ◽  
Licinio Rocha ◽  
Milos Nesladek ◽  
...  
Keyword(s):  
Single Crystal ◽  
Microwave Plasma ◽  
Plasma Reactor ◽  
Optical Emission ◽  
Cvd Diamond ◽  
Diamond Growth ◽  
Photocurrent Spectroscopy ◽  
Excited Species ◽  
Single Crystal Diamond

ABSTRACTDue to its radiation harness, single crystal CVD diamond is a remarkable material for the construction of detectors used in hadron physics and for medical therapy. In this work, single crystal CVD diamond plates were grown in a microwave plasma reactor, using home design substrate holder and a relatively high pressure. Optical Emission Spectroscopy was employed during the MW-PECVD growth to characterize excited species present in the plasma and to detect the presence of residual gases such as nitrogen which is unsuitable for detector's applications.The samples were characterized using various methods such as Raman spectroscopy, photoluminescence (PL), photocurrent spectroscopy, Raman mapping, birefringence microscopy, optical microscopy and also AFM. The best sample, exhibits a FWHM for the 1332 cm−1 Raman peak about 1.6 cm−1. Room temperature PL spectra showed no N–related luminescence, confirming the high quality of the grown single crystal diamond.

Effect of depth of Buried-In Tungsten Electrodes on Single Crystal Diamond Photodetector

MRS Advances ◽  
2016 ◽  
Vol 1 (16) ◽  
pp. 1099-1104 ◽  
Author(s):  
Z.C. Liu ◽  
F.N. Li ◽  
W. Wang ◽  
J.W. Zhang ◽  
F. Lin ◽  
...  
Keyword(s):  
Single Crystal ◽  
Epitaxial Layer ◽  
Three Dimensional ◽  
Electrode Structure ◽  
Tungsten Electrodes ◽  
High Pressure High Temperature ◽  
Diamond Substrate ◽  
Single Crystal Diamond ◽  
New Type ◽  
Different Depths

AbstractThe performance of new type three dimensional buried-in electrode structure ultraviolet photodetector fabricated on single crystal diamond epitaxial layer was investigated. The epitaxial layer was grown on high-pressure-high-temperature Ib-type diamond substrate. Then the buried-in electrodes with different depths were formed by oxygen plasma reactive ion etching method and radio frequency magnetron sputtering technique on this diamond layer. Compared with that of traditional planar electrode photodetector, the responsivity of buried-in electrode photodetector shows higher value, which reaches the highest when the electrode depth is 100 nm.

On The Optimized Nucleation of Near-Single-Crystal Cvd Diamond Film

1995 ◽  
Vol 416 ◽  
Author(s):  
L. C. Chen ◽  
C. C. Juan ◽  
J. Y. Wu ◽  
K. H. Chen ◽  
J. W. Teng
Keyword(s):  
Single Crystal ◽  
Photoelectron Spectroscopy ◽  
Morphological Evolution ◽  
Present Report ◽  
Ex Situ ◽  
Nucleation Density ◽  
Induced Current ◽  
Current Time ◽  
Single Crystal Diamond

ABSTRACTNear-single-crystal diamond films have been obtained in a number of laboratories recently. The optimization of nucleation density by using a bias-enhanced nucleation (BEN) method is believed to be a critical step. However, the condition of optimized nucleation has never been clearly delineated. In the present report, a novel quantitative technique was established to monitor the nucleation of diamond in-situ. Specifically, the induced current was measured as a function of nucleation time during BEN. The timedependence of induced current was studied under various methane concentrations as well as substrate temperatures. The optimized nucleation condition can be unambiguously determined from the current-time plot. Besides the in-situ current probe, ex-situ x-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were also used to investigate the chemical and morphological evolution. Characteristic XPS and AFM features of optimized nucleation is discussed.

Fine-control-valve of halide perovskite single crystal quality for high performance X-ray detection

2021 ◽  
Author(s):  
Weijun Li ◽  
Huayang Li ◽  
Jinmei Song ◽  
Chunjie Guo ◽  
Huimao Zhang ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
Control Valve ◽  
Crystal Quality ◽  
X Ray ◽  
Fine Control ◽  
Halide Perovskite

scholarly journals Single crystal diamond gain mirrors for high performance vertical external cavity surface emitting lasers

2020 ◽  
Vol 104 ◽  
pp. 107744
Author(s):  
Gergely Huszka ◽  
Nicolas Malpiece ◽  
Mehdi Naamoun ◽  
Alexandru Mereuta ◽  
Andreï Caliman ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
External Cavity ◽  
Cavity Surface ◽  
Single Crystal Diamond ◽  
Surface Emitting Lasers ◽  
Emitting Lasers

Growth and Characterization of Single Crystal Epitaxial CoGa on MBE Grown III-V Semiconductors

1988 ◽  
Vol 144 ◽  
Author(s):  
K. C. Garrison ◽  
C. J. Palmstrøm ◽  
R. A. Bartynski
Keyword(s):  
Substrate Temperature ◽  
Single Crystal ◽  
Single Crystals ◽  
Structural Quality ◽  
High Quality ◽  
Auger Analysis ◽  
Post Deposition

ABSTRACTWe have demonstrated growth of high quality single crystal CoGa films on Ga1−xAlxAs. These films were fabricated in-situ by codeposition of Co and Ga on MBE grown Ga1−xAlxAs(100) surfaces. The elemental composition of the films was determined using Rutherford Backscattering (RBS) and in-situ Auger analysis. The structural quality of the films' surfaces was studied using RHEED (during deposition) and LEED (post deposition). RBS channeling was used to determine the bulk crystalline quality of these films.For ∼500 Å CoGa films grown at ∼450°C substrate temperature, channeling data showed good quality epitaxial single crystals [χmin ∼7%] with minimal dechanneling at the interface.

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