scholarly journals RESULTS OF TESTS OF CONTROL SYSTEMS ON EXPOSURE TO HEAVY CHARGED PARTICLES

2021 ◽  
Author(s):  
Konstantin Zolnikov ◽  
K. Tapero ◽  
Valeriy Suhanov ◽  
D. Chernov

The article discusses the results of the ERI tests for the effects of heavy charged particles. The data that arose during the irradiation of single radiation effects are presented. During the irradi-ation of the samples, the measurement of the integral flux (fluence) of ions was carried out using track detectors. To conduct the tests, technological equipment was used that implements the operating modes of the tested analog-to-digital converter and provides measurement of the parameters-the validity criteria. When irradiating samples with ions, the occurrence of a thyristor effect, cata-strophic failure and functional interruption effects were not recorded.

2021 ◽  
Author(s):  
V. Zolnikov ◽  
I. Strukov ◽  
K. Chubur ◽  
Yu. Chevychelov ◽  
A. Yankov

This article discusses the development of effective methods and tools for assessing the fault tolerance of logical circuits, the mechanism of logical masking, the development of the route of re-synthesis of combinational circuits, methods for increasing fault tolerance. A method of iterative circuit modification is proposed, due to an increase in the level of logical masking of the circuit.


Doklady BGUIR ◽  
2020 ◽  
Vol 18 (7) ◽  
pp. 55-62
Author(s):  
I. Yu. Lovshenko ◽  
V. R. Stempitsky ◽  
V. T. Shandarovich

The use of microelectronic products in outer space is possible if protection is provided against special external influencing factors, including radiation effect. For digital integrated circuits manufactured using submicron CMOS processes, the greatest influence is exerted by radiation effects caused by exposure to a heavy charged particle. The use of special design tools in the development of dual-purpose microcircuits, with increased resistance to the impact of heavy charged particles, prevents single events from occurring. Thus, the use of modern software products for device and technological modeling in microelectronics when developing the element base of radiation-resistant microcircuits for space purposes will cut the time to develop new products and make it possible to modernize (improve performance) already existing device and circuitry solutions. The paper delivers the results of modeling the impacts of heavy charged particles with a magnitude of linear energy transfer equal to 1.81, 10.1, 18.8, 55.0 MeV·cm2/mg, corresponding to nitrogen ions 15N+4 with an energy E = 1,87 MeV; argon 40Ar+12 with an energy E = 372 MeV; ferrum 56Fe+15 with an energy E = 523 MeV; xenon 131Xe+35 with an energy E = 1217 MeV, on electrical characteristics of n-MOSFET device structure. The dependences of the maximum drain current IС on the motion trajectory of a heavy charged particle and the ambient temperature are shown.


2021 ◽  
Vol 21 (1) ◽  
pp. 43-46
Author(s):  
O. Gaponyuk ◽  
A. Aleksashin ◽  
G. Goncharuk

High productivity and power of technological and transport mechanisms, large capacity and number of storage equipment, a variety of types of grain crops simultaneously processed at the elevator require the operator to make a lightning-fast decision, the optimal choice of grain transportation routes.One of the first control systems consisted of huge energy-intensive cabinets with starting equipment, allowing remote control of equipment, without the functions of elementary control of their operation.As storage volumes increased, these systems were supplemented with relay cabinets, whose task was to conduct interlocked control of an ever-increasing number of mechanisms, so that at least somehow it was possible to control such a complex. These relay cabinets had a low degree of reliability (contact elements), consumed a large amount of energy, and required the constant presence of large maintenance personnel.The era of microelectronics has come, which completely changed the idea of the capabilities of control systems. At first, it seemed very expensive and not a quick payback. But every year, the cost of automation equipment is decreasing, reliability has grown to high levels and this technique has come to the management systems of grain storages and elevators.Modern automation at the majority of Ukrainian elevators makes it possible to control technological processes. At the same time, many processes are regulated in a mode that requires a sufficiently high qualification of service personnel. The exchange of data on the operation of SMART-INDIVIDUAL equipment is carried out by logical controllers by polling sensors, generating control actions, monitoring equipment operating modes with display in the WEB-interface system. The SMART-INDIVIDUAL system has undeniable advantages over existing centralized control and management systems. SMART technology is inextricably linked with the dispatch control and data collection system - SCADA, designed to monitor and supervise a large number of remote objects or one geographically distributed object. The SMART-INDIVIDUAL system is equipped with a module with a regulation for monitoring parameters, equipment according to the passport characteristics. At the same time, the system maintains an archive and controls the timing of maintenance. The laboratory installation SMART-INDIVIDUAL includes technological and transport equipment, which is most used in the elevator industry: air filter ZEO-FCS, bucket elevator ZEO-BE, scraper chain conveyor ZEO-DC. On the basis of the SMART-INDIVIDUAL software and hardware complex at the Department of Technological Equipment for Grain Production of the Odessa National Academy of Food Technologies, students are trained in the new specialty "IT service of equipment".


1988 ◽  
Author(s):  
Frank Morris ◽  
W. R. Wisseman

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