Displacement damage effects in proton irradiated vertical-cavity surface-emitting lasers

Author(s):  
Jiawei chen ◽  
yudong li ◽  
Heini Maliya ◽  
Bingkai Liu ◽  
Qi Guo ◽  
...  

Abstract The displacement damage effects of vertical-cavity surface-emitting lasers (VCSELs) irradiated by 3 and 10 MeV protons in the range of Ф = 6.7×1012 p/cm2 to Ф = 1.6×1014 p/cm2 were investigated. The threshold current exhibited consistent degradation at the same displacement damage dose, as did the series resistance. Additionally, the external quantum efficiencies of 850 and 680 nm VCSELs were degraded by 2% and 21%, respectively. Further, the threshold current of the 850 nm VCSEL was restored by 14% after annealing at 20 mA, which is remarkably higher than that achieved by annealing only at high temperatures. These results support the applicability of VCSELs to both data communication and instrumentation applications in harsh radiation environments.

1994 ◽  
Vol 05 (04) ◽  
pp. 667-730 ◽  
Author(s):  
MAREK OSIŃSKI ◽  
WŁODZIMIERZ NAKWASKI

A comprehensive review of temperature-related effects and thermal modeling of vertical-cavity surface-emitting lasers (VCSELs) is presented. The paper is divided into two major parts. First, the effects of temperature on device characteristics are discussed, including the temperature dependence of the longitudinal mode spectra, the threshold current, the transverse-mode structure, and the output power. A new condition is formulated for thermal matching of the Bragg mirrors and the spacer region and a comparison is made between characteristic temperatures for the threshold current (T0) and for the external quantum efficiency (Tη). In the second part, various approaches to thermal modeling of VCSELs are described. Both simplified and comprehensive thermal models are considered and both analytical and numerical approaches are discussed. A new analytical approximate method for analysis of heat-flux spreading in multilayer structures is described. The most important results obtained with the aid of these models are presented. In particular, we show that the current dependence of thermal resistance is very sensitive to VCSEL structure, and is strongly influenced by the relative distribution of heat sources and their location with respect to the heat sink.


2012 ◽  
Vol 21 (3) ◽  
pp. 034206 ◽  
Author(s):  
Zhen-Bo Zhao ◽  
Chen Xu ◽  
Yi-Yang Xie ◽  
Kang Zhou ◽  
Fa Liu ◽  
...  

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