Flicker Noise in Opto-Electronic Oscillator and Photonic-Delay Homodyne Phase Noise Measurement System

In this paper, the effect of device flicker noise on the characteristics of both opto-electronic oscillator and Photonic-delay homodyne phase noise measurement system is analyzed. An analytic theory model of opto-electronic oscillator (OEO) is derived and verified by experiments in this paper, where the flicker and white noise are both considered. The sensitivity of Photonic-delay homodyne phase noise measurement system is improved by using high-linear photodetector and low-phase noise amplifier resulting from decreasing systematic phase noise.