A novel design layout of three disjoint paths multistage interconnection network & its reliability analysis

Purpose The purpose of this paper is to design a efficient layout of Multistage interconnection network which has cost effective solution with high reliability and fault-tolerence capability. For parallel computation, various multistage interconnection networks (MINs) have been discussed hitherto in the literature, however, these networks always required further improvement in reliability and fault-tolerance capability. The fault-tolerance capability of the network can be achieved by increasing the number of disjoint paths as a result the reliability of the interconnection networks is also improved. Design/methodology/approach This proposed design is a modification of gamma interconnection network (GIN) and three disjoint path gamma interconnection network (3-DGIN). It has a total seven number of paths for all tag values which is uniform out of these seven paths, three paths are disjoint paths which increase the fault tolerance capability by two faults. Due to the presence of more paths than the GIN and 3-DGIN, this proposed design is more reliable. Findings In this study, a new design layout of a MIN has been proposed which provides three disjoint paths and uniformity in terms of an equal number of paths for all source-destination (S-D) pairs. The new layout contains fewer nodes as compared to GIN and 3-DGIN. This design provides a symmetrical structure, low cost, better terminal reliability and provides an equal number of paths for all tag values (|S-D|) when compared with existing MINs of this class. Originality/value A new design layout of MINs has been purposed and its two terminal reliability is calculated with the help of the reliability block diagram technique.

Reliability Estimation of 4 × 4 SENs Using UGF Method

Shuffle Exchange Networks (SENs) are considered as an appropriate interconnection network because they consist of switching elements of small size and possess a straight forward and simple configuration. In this paper, we have proposed a method for analyzing reliability of 4×4 SEN, 4×4 SEN+1 and 4×4 SEN+2. The reliability has been obtained on the basis of three indices, namely, terminal reliability, broadcast reliability and network reliability by using universal generating function (UGF) method. This study also examines effect of adding the additional stages in 4×4 shuffle exchange networks (SENs).

Uniformly Most Reliable Three-Terminal Graph of Dense Graphs

A graph G with k specified target vertices in vertex set is a k -terminal graph. The k -terminal reliability is the connection probability of the fixed k target vertices in a k -terminal graph when every edge of this graph survives independently with probability p . For the class of two-terminal graphs with a large number of edges, Betrand, Goff, Graves, and Sun constructed a locally most reliable two-terminal graph for p close to 1 and illustrated by a counterexample that this locally most reliable graph is not the uniformly most reliable two-terminal graph. At the same time, they also determined that there is a uniformly most reliable two-terminal graph in the class obtained by deleting an edge from the complete graph with two target vertices. This article focuses on the uniformly most reliable three-terminal graph of dense graphs with n vertices and m edges. First, we give the locally most reliable three-terminal graphs of n and m in certain ranges for p close to 0 and 1. Then, it is proved that there is no uniformly most reliable three-terminal graph with specific n and m , where n ≥ 7 and n 2 − ⌊ n − 3 / 2 ⌋ ≤ m ≤ n 2 − 2 . Finally, some uniformly most reliable graphs are given for n vertices and m edges, where 4 ≤ n ≤ 6 and m = n 2 − 2 or n ≥ 5 and m = n 2 − 1 .

Hybrid algorithm for two-terminal reliability evaluation in communication networks

<span>Network reliability is valuable in establishing a survivable communication network. Reliability evaluation algorithms are used in the design stage and during the network deployment. This work presents a new multistage hybrid technique for two-terminal reliability evaluation problem. It is based on a combination of graph reduction techniques and tie-set method. A new approach has been introduced for deducing tie-sets in a network containing both unidirectional and bi-directional edges. The proposed algorithm can be applied for both simple and complex networks without restrictions. The results confirm that new algorithm evaluates network's reliability with decreasing computing time compared to classical algorithms. The results for a case study of a 20-node network have demonstrated that the required time for reliability evaluation is decreased from (t&gt;1 hour) in the case of using a classical algorithm, to (t&lt;1 second) for the new algorithm.</span>

A Minimal Path-Based Method for Computing Multistate Network Reliability

Most of modern technological networks that can perform their tasks with various distinctive levels of efficiency are multistate networks, and reliability is a fundamental attribute for their safe operation and optimal improvement. For a multistate network, the two-terminal reliability at demand level d, defined as the probability that the network capacity is greater than or equal to a demand of d units, can be calculated in terms of multistate minimal paths, called d-minimal paths (d-MPs) for short. This paper presents an efficient algorithm to find all d-MPs for the multistate two-terminal reliability problem. To advance the solution efficiency of d-MPs, an improved model is developed by redefining capacity constraints of network components and minimal paths (MPs). Furthermore, an effective technique is proposed to remove duplicate d-MPs that are generated multiple times during solution. A simple example is provided to demonstrate the proposed algorithm step by step. In addition, through computational experiments conducted on benchmark networks, it is found that the proposed algorithm is more efficient.