aluminum oxynitride
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Coatings ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 1424
Author(s):  
Mariola Robakowska ◽  
Łukasz Gierz ◽  
Hubert Gojzewski

This article describes the modification of UV-curable coatings with silicon aluminum oxynitride (Sialon) and aluminum oxide (Alu C), which improve the hydrophobicity of the coating surface and the scratch hardness. The contact angle is greater due to surface roughness being enhanced with inorganic fillers. Improved scratch resistance results from the formation of a sliding layer triggered by the diffusion of Sialon or alumina on the coating surface. One can observed an increase in the surface hydrophobicity as well as in the scratch hardness (up to 100%) when small amounts (5 wt.%) of the inorganic compounds are added. Imaging microscopies, i.e., SEM, OM, and AFM (with nanoscopic Young’s modulus determination), revealed the good distribution of both types of fillers in the studied matrix.


2021 ◽  
pp. 151982
Author(s):  
Hongzheng Zhu ◽  
Mohammad Hossein Aboonasr Shiraz ◽  
Liang Liu ◽  
Yue Zhang ◽  
Jian Liu

Materials ◽  
2021 ◽  
Vol 14 (15) ◽  
pp. 4182
Author(s):  
Alan Wilmański ◽  
Magdalena Zarzecka-Napierała ◽  
Zbigniew Pędzich

This paper describes combusting loose powder beds of mixtures of aluminum metal powders and aluminum oxide powders with various grain sizes under various nitrogen pressure. The synthesis conditions required at least 20/80 weight ratio of aluminum metal powder to alumina powder in the mix to reach approximately 80 wt% of γ-AlON in the products. Finely ground fused white alumina with a mean grain size of 5 μm was sufficient to achieve results similar to very fine alumina with 0.3 μm grains. A lower nitrogen pressure of 1 MPa provided good results, allowing a less robust apparatus to be used. The salt-assisted combustion synthesis upon addition of 10 wt% of ammonium nitrite resulted in a slight increase in product yield and allowed lower aluminum metal powder content in mixes to be ignited. Increasing the charge mass five times resulted in a very similar γ-AlON yield, providing a promising technology for scaling up. Synthesis in loose powder beds could be utilized for effective production of relatively cheap and uniform AlON powder, which could be easily prepared for forming and sintering without intensive grounding and milling, which usually introduce serious contamination.


2021 ◽  
Vol 12 (3) ◽  
pp. 638-642
Author(s):  
V. F. Shamray ◽  
A.V. Samokhin ◽  
V. P. Sirotinkin ◽  
A. G. Astashov ◽  
A. S. Gordeev

2021 ◽  
Vol 403 ◽  
pp. 126382
Author(s):  
Jianyan Ding ◽  
Yan Wei ◽  
Weiqing Liu ◽  
Yanyan Li ◽  
Quansheng Wu ◽  
...  

2020 ◽  
Vol 104 (2) ◽  
pp. 1040-1046
Author(s):  
Shuixian Yang ◽  
Hetuo Chen ◽  
Jianmin Li ◽  
Hao Guo ◽  
Xiaojian Mao ◽  
...  

Materials ◽  
2020 ◽  
Vol 13 (7) ◽  
pp. 1538 ◽  
Author(s):  
Hyun-Seop Kim ◽  
Myoung-Jin Kang ◽  
Jeong Jin Kim ◽  
Kwang-Seok Seo ◽  
Ho-Young Cha

This study investigated the effects of a thin aluminum oxynitride (AlOxNy) gate insulator on the electrical characteristics of AlGaN/GaN-on-SiC metal-insulator-semiconductor high electron mobility transistors (MIS-HEMTs). The fabricated AlGaN/GaN-on-SiC MIS-HEMTs exhibited a significant reduction in gate leakage and off-state drain currents in comparison with the conventional Schottky-gate HEMTs, thus enhancing the breakdown voltage. The effects of gate recess were also investigated while using recessed MIS-HEMT configuration. The Johnson’s figures of merit (= fT × BVgd) for the fabricated MIS-HEMTs were found to be in the range of 5.57 to 10.76 THz·V, which is the state-of-the-art values for GaN-based HEMTs without a field plate. Various characterization methods were used to investigate the quality of the MIS and the recessed MIS interface.


Author(s):  
Е.В. Фомин ◽  
А.Д. Бондарев ◽  
И.П. Сошников ◽  
N.B. Bercu ◽  
L. Giraudet ◽  
...  

The paper presents the results of the synthesis of thin aluminum nitride films by reactive ion-plasma sputtering and the study of their properties with the aim of using as the protective coatings for the high-power AlxGa1-xAs/GaAs semiconductor laser heterostructures. EDS studies and ellipsometry showed that at a residual pressure in the chamber of the order of ~10-5 Torr, a layer of aluminum oxynitride is formed in the films. In this case, the film-substrate heterointerface can undergo oxidation. However, AlN films with a thickness of the order of 100 nm grown in a pure nitrogen medium with a residual pressure of ~10-7 Torr apparently do not contain oxygen, and can reliably prevent its penetration into the heterointerface region. Potentially, they can serve as effective protection for oxidation sensitive heterostructures.


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