Applied Scanning Probe Methods - NanoScience and Technology
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Published By Springer Berlin Heidelberg

9783540005278, 9783642357923

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Micro-Nano Scale Thermal Imaging Using Scanning Probe Microscopy

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_11 ◽

2004 ◽

pp. 327-362 ◽

Cited By ~ 9

Author(s):

Li Shi ◽

Arun Majumdar

Keyword(s):

Scanning Probe Microscopy ◽

Thermal Imaging ◽

Scanning Probe ◽

Probe Microscopy ◽

Nano Scale

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Displacement and Strain Field Measurements from SPM Images

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_8 ◽

2004 ◽

pp. 253-276 ◽

Cited By ~ 10

Author(s):

Jürgen Keller ◽

Dietmar Vogel ◽

Andreas Schubert ◽

Bernd Michel

Keyword(s):

Strain Field ◽

Field Measurements

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Tip Characterization for Dimensional Nanometrology

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_5 ◽

2004 ◽

pp. 147-168 ◽

Cited By ~ 4

Author(s):

John S. Villarrubia

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Super Density Optical Data Storage by Near-Field Optics

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_14 ◽

2004 ◽

pp. 429-437

Author(s):

Jun Tominaga

Keyword(s):

Data Storage ◽

Near Field ◽

Optical Data Storage ◽

Optical Data ◽

Near Field Optics

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Visualization of Polymer Structures with Atomic Force Microscopy

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_7 ◽

2004 ◽

pp. 207-251 ◽

Cited By ~ 10

Author(s):

Sergei Magonov

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Sensor Technology for Scanning Probe Microscopy

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_4 ◽

2004 ◽

pp. 117-146

Author(s):

Egbert Oesterschulze ◽

Rainer Kassing

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Sensor Technology ◽

Probe Microscopy

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Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM)

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_15 ◽

2004 ◽

pp. 439-458

Author(s):

Ryoichi Yamamoto

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SPM Manipulation and Modifications and Their Storage Applications

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_13 ◽

2004 ◽

pp. 389-428

Author(s):

Sumio Hosaka

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Micro/Nanotribology Studies Using Scanning Probe Microscopy

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_6 ◽

2004 ◽

pp. 171-205 ◽

Cited By ~ 3

Author(s):

Bharat Bhushan

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Mechanical Properties of Self-Assembled Organic Monolayers: Experimental Techniques and Modeling Approaches

Applied Scanning Probe Methods - NanoScience and Technology ◽

10.1007/978-3-642-35792-3_10 ◽

2004 ◽

pp. 303-326

Author(s):

Redhouane Henda

Keyword(s):

Mechanical Properties ◽

Experimental Techniques ◽

Organic Monolayers ◽

Modeling Approaches ◽

Self Assembled

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Applied Scanning Probe Methods - NanoScience and TechnologyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Micro-Nano Scale Thermal Imaging Using Scanning Probe Microscopy

Displacement and Strain Field Measurements from SPM Images

Tip Characterization for Dimensional Nanometrology

Super Density Optical Data Storage by Near-Field Optics

Visualization of Polymer Structures with Atomic Force Microscopy

Sensor Technology for Scanning Probe Microscopy

Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM)

SPM Manipulation and Modifications and Their Storage Applications

Micro/Nanotribology Studies Using Scanning Probe Microscopy

Mechanical Properties of Self-Assembled Organic Monolayers: Experimental Techniques and Modeling Approaches

Applied Scanning Probe Methods - NanoScience and Technology
Latest Publications