2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
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82

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6

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Published By IEEE

9781479913619

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Performance characteristics of 14 nm near threshold MCML circuits

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716545 ◽

2013 ◽

Author(s):

Alexander Shapiro ◽

Eby G. Friedman

Keyword(s):

Performance Characteristics ◽

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Envelope Tracking power amplifier optimization for mobile applications

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716534 ◽

2013 ◽

Author(s):

James P. Young ◽

David Ripley ◽

Phil Lehtola

Keyword(s):

Power Amplifier ◽

Mobile Applications ◽

Envelope Tracking

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Conference committee

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716504 ◽

2013 ◽

Keyword(s):

Conference Committee

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GaP source-drain SOI 1T-DRAM: Solving the key technological challenges

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716573 ◽

2013 ◽

Author(s):

Ashish Pal ◽

Aneesh Nainani ◽

Zhiyuan Ye ◽

Xinyu Bao ◽

Errol Sanchez ◽

...

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Design of a robust and ultra-low-voltage pulse-triggered flip-flop in 28nm UTBB-FDSOI technology

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716555 ◽

2013 ◽

Author(s):

Sebastien Bernard ◽

Alexandre Valentian ◽

Marc Belleville ◽

David Bol ◽

Jean-Didier Legat

Keyword(s):

Voltage Pulse ◽

Low Voltage ◽

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A trench isolated thick SOI process as platform for various electrical and optical integrated devices

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716538 ◽

2013 ◽

Author(s):

R. Lerner ◽

D. Gaebler ◽

K. Schottmann ◽

S. Hering

Keyword(s):

Integrated Devices

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SOI lateral bipolar transistor with drive current >3mA/μm

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716518 ◽

2013 ◽

Author(s):

J. Cai ◽

T. H. Ning ◽

C. D'Emic ◽

J.-B. Yau ◽

K. K. Chan ◽

...

Keyword(s):

Bipolar Transistor ◽

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Fin width scaling for improved short channel control and performance in aggressively scaled channel length SOI finFETs

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716521 ◽

2013 ◽

Author(s):

Abhijeet Paul ◽

Chun-chen Yeh ◽

Theodorus Standaert ◽

Jeffrey. B. Johnson ◽

Andres Bryant ◽

...

Keyword(s):

Channel Length ◽

Short Channel ◽

And Performance ◽

Channel Control

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Robust clock tree using single-well cells for multi-VT 28nm UTBB FD-SOI digital circuits

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716540 ◽

2013 ◽

Author(s):

B. Giraud ◽

J. P. Noel ◽

F. Abouzeid ◽

S. Clerc ◽

Y. Thonnart

Keyword(s):

Digital Circuits ◽

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3D hetero-integration technology with backside TSV and reliability challenges

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716516 ◽

2013 ◽

Author(s):

Kang-Wook Lee ◽

M. Murugesan ◽

T. Fukushima ◽

T. Tanaka ◽

M. Koyanagi

Keyword(s):

Integration Technology

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