Requirements of Oxides as Gate Dielectricsfor CMOS Devices

Topics in Applied Physics - Rare Earth Oxide Thin Films ◽

10.1007/11499893_21 ◽

2006 ◽

pp. 367-377 ◽

Cited By ~ 2

Author(s):

Gennadi Bersuker ◽

Peter Zeitzoff

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