Efficient Totally Self-Checking Shifter Design

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_3 ◽

1998 ◽

pp. 29-39

Author(s):

Ricardo O. Duarte ◽

M. Nicolaidis ◽

H. Bederr ◽

Y. Zorian

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