On-Line Testing for VLSI - Frontiers in Electronic Testing
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15

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Published By Springer US

9781441950338, 9781475760699

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Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_9 ◽

1998 ◽

pp. 93-99

Author(s):

Karim Arabi ◽

Bozena Kaminska

Keyword(s):

Temperature Sensors ◽

Thermal Monitoring ◽

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Self-Testing Embedded Two-Rail Checkers

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_7 ◽

1998 ◽

pp. 69-79 ◽

Author(s):

Dimitris Nikolos

Keyword(s):

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Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_6 ◽

1998 ◽

pp. 63-68 ◽

Author(s):

Stanisław J. Piestrak

Keyword(s):

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A New Design Method for Self-Checking Unidirectional Combinational Circuits

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_4 ◽

1998 ◽

pp. 41-53 ◽

Author(s):

V. V. Saposhnikov ◽

A. Morosov ◽

VL. V. Saposhnikov ◽

M. Gössel

Keyword(s):

Design Method ◽

Combinational Circuits

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Efficient Totally Self-Checking Shifter Design

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_3 ◽

1998 ◽

pp. 29-39

Author(s):

Ricardo O. Duarte ◽

M. Nicolaidis ◽

H. Bederr ◽

Y. Zorian

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Thermal Monitoring of Self-Checking Systems

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_8 ◽

1998 ◽

pp. 81-92 ◽

Author(s):

V. Székely ◽

M. Rencz ◽

J. M. Karam ◽

M. Lubaszewski ◽

B. Courtois

Keyword(s):

Thermal Monitoring

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Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_15 ◽

1998 ◽

pp. 153-159

Author(s):

Y. Levendel

Keyword(s):

Telecommunication Services ◽

System Components

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Scalable Test Generators for High-Speed Datapath Circuits

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_11 ◽

1998 ◽

pp. 111-125 ◽

Author(s):

Hussain Al-Asaad ◽

John P. Hayes ◽

Brian T. Murray

Keyword(s):

Datapath Circuits

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On-Line Fault Monitoring

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_2 ◽

1998 ◽

pp. 21-27

Author(s):

J. J. Stiffler

Keyword(s):

Fault Monitoring ◽

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A BIST Scheme for Non-Volatile Memories

On-Line Testing for VLSI - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6069-9_13 ◽

1998 ◽

pp. 139-144

Author(s):

Piero Olivo ◽

Marcello Dalpasso

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