Physical Basis of Interference Effects in Hearing

International Conference on Theoretical Physics ◽

10.1007/978-3-0348-7907-1_51 ◽

2003 ◽

pp. 667-669

Author(s):

Thomas Duke ◽

Daniel Andor ◽

Frank Jülicher

Keyword(s):

Physical Basis ◽

Interference Effects

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Physical Basis of Interference Effects in Hearing

Annales Henri Poincaré ◽

10.1007/s00023-003-0951-9 ◽

2003 ◽

Vol 4 (S2) ◽

pp. 667-669

Author(s):

Thomas Duke ◽

Daniel Andor ◽

Frank Jülicher

Keyword(s):

Physical Basis ◽

Interference Effects

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Some Aspects of Exelfs Analysis in the Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600000477 ◽

1980 ◽

Vol 38 ◽

pp. 118-119

Author(s):

D. E. Johnson ◽

S. Csillag

Keyword(s):

Fine Structure ◽

Electron Microscope ◽

Energy Loss ◽

Analytical Electron Microscopy ◽

Interference Effects ◽

Interatomic Distances ◽

X Ray ◽

Structure Information ◽

Microanalytical Technique ◽

Analytical Electron

Recently, the applications area of analytical electron microscopy has been extended to include the study of Extended Energy Loss Fine Structure (EXELFS). Modulations past an ionization edge in the energy loss spectrum (EXELFS), contain atomic fine structure information similar to Extended X-ray Absorbtion Fine Structure (EXAFS). At low momentum transfer the main contribution to these modulations comes from interference effects between the outgoing excited inner shell electron waves and electron waves backscattered from the surrounding atoms. The ability to obtain atomic fine structure information (such as interatomic distances) combined with the spatial resolution of an electron microscope is unique and makes EXELFS an important microanalytical technique.

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