Residual Donor Impurities in Undoped LEC SI-GaAs Crystals

Springer Series in Chemical Physics - Secondary Ion Mass Spectrometry SIMS IV ◽

10.1007/978-3-642-82256-8_76 ◽

1984 ◽

pp. 288-290

Author(s):

K. Kuramoto ◽

M. Nakajima ◽

T. Kikuta ◽

F. Orito ◽

H. Emori ◽

...

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