Electromagnetic Noises

VLSI Design and Test for Systems Dependability ◽

10.1007/978-4-431-56594-9_4 ◽

2018 ◽

pp. 129-161

Author(s):

Makoto Nagata ◽

Nobuyuki Yamasaki ◽

Yusuke Kumura ◽

Shuma Hagiwara ◽

Masayuki Inaba

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