VLSI Design and Test for Systems Dependability
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Published By Springer Japan

9784431565925, 9784431565949
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Unknown Threats and Provisions

2018 ◽  
pp. 475-509
Author(s):  
Nobuyasu Kanekawa ◽  
Takashi Miyoshi ◽  
Masahiro Fujita ◽  
Takeshi Matsumoto ◽  
Hiroaki Yoshida ◽  
...  

Malicious Attacks on Electronic Systems and VLSIs for Security

2018 ◽  
pp. 395-437
Author(s):  
Takeshi Fujino ◽  
Daisuke Suzuki ◽  
Yohei Hori ◽  
Mitsuru Shiozaki ◽  
Masaya Yoshikawa ◽  
...  
Keyword(s):  
Electronic Systems ◽  
Malicious Attacks

Radiation-Induced Soft Errors

2018 ◽  
pp. 57-127 ◽  
Author(s):  
Eishi H. Ibe ◽  
Shusuke Yoshimoto ◽  
Masahiko Yoshimoto ◽  
Hiroshi Kawaguchi ◽  
Kazutoshi Kobayashi ◽  
...  
Keyword(s):  
Soft Errors ◽  
Radiation Induced

Electromagnetic Noises

2018 ◽  
pp. 129-161
Author(s):  
Makoto Nagata ◽  
Nobuyuki Yamasaki ◽  
Yusuke Kumura ◽  
Shuma Hagiwara ◽  
Masayuki Inaba

A Low-Latency DMR Architecture with Fast Checkpoint Recovery Scheme Using Simultaneously Copyable SRAM

2018 ◽  
pp. 709-718
Author(s):  
Masahiko Yoshimoto ◽  
Go Matsukawa ◽  
Yohei Nakata ◽  
Hiroshi Kawaguchi ◽  
Yasuo Sugure ◽  
...  
Keyword(s):  
Low Latency ◽  
Checkpoint Recovery ◽  
Recovery Scheme

Design of SRAM Resilient Against Dynamic Voltage Variations

2018 ◽  
pp. 579-591
Author(s):  
Masahiko Yoshimoto ◽  
Yohei Nakata ◽  
Yuta Kimi ◽  
Hiroshi Kawaguchi ◽  
Makoto Nagata ◽  
...  
Keyword(s):  
Dynamic Voltage

DART—A Concept of In-field Testing for Enhancing System Dependability

2018 ◽  
pp. 553-577
Author(s):  
Kazumi Hatayama ◽  
Seiji Kajihara ◽  
Tomokazu Yoneda ◽  
Yuta Yamato ◽  
Michiko Inoue ◽  
...  
Keyword(s):  
Field Testing
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