An experimental approach to karmarkar’s projective method for linear programming

1987 ◽  
pp. 175-191 ◽  
Author(s):  
J. A. Tomlin
Keyword(s):  
Linear Programming ◽  
Experimental Approach ◽  
Projective Method

Karmarkar's projective method for linear programming: A computational appraisal

1989 ◽  
Vol 16 (1) ◽  
pp. 189-206 ◽  
Author(s):  
Mahesh H. Dodani ◽  
A.J.G. Babu
Keyword(s):  
Linear Programming ◽  
Projective Method

On Projected Newton Barrier Methods for Linear Programming and an Equivalence to Karmarkar's Projective Method.

1985 ◽  
Author(s):  
P. E. Gill ◽  
W. Murray ◽  
M. A. Saunders ◽  
J. A. Tomlin ◽  
M. H. Wright
Keyword(s):  
Linear Programming ◽  
Barrier Methods ◽  
Projective Method

On projected newton barrier methods for linear programming and an equivalence to Karmarkar’s projective method

1986 ◽  
Vol 36 (2) ◽  
pp. 183-209 ◽  
Author(s):  
Philip E. Gill ◽  
Walter Murray ◽  
Michael A. Saunders ◽  
J. A. Tomlin ◽  
Margaret H. Wright
Keyword(s):  
Linear Programming ◽  
Barrier Methods ◽  
Projective Method

Karmarkar's projective method for linear programming: A computational survey

1987 ◽  
Vol 13 (1-4) ◽  
pp. 285-289
Author(s):  
Mahesh H. Dodani ◽  
A.J.G. Babu
Keyword(s):  
Linear Programming ◽  
Projective Method

A projective method for linear programming with box-type constraints

Algorithmica ◽  
1986 ◽  
Vol 1 (1-4) ◽  
pp. 517-527 ◽  
Author(s):  
G. Rinaldi
Keyword(s):  
Linear Programming ◽  
Projective Method

Experimental Determination of the Effective Resolution Limit in Thick Specimens at High Voltages

1975 ◽  
Vol 33 ◽  
pp. 664-665
Author(s):  
Mircea Fotino
Keyword(s):  
Experimental Approach ◽  
Chromatic Aberration ◽  
Resolving Power ◽  
Biological Research ◽  
Specimen Thickness ◽  
Resolution Limit ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
Resolution Level

The use of thick specimens (0.5 μm to 5.0 μm or more) is one of the most resourceful applications of high-voltage electron microscopy in biological research. However, the energy loss experienced by the electron beam in the specimen results in chromatic aberration and thus in a deterioration of the effective resolving power. This sets a limit to the maximum usable specimen thickness when investigating structures requiring a certain resolution level.An experimental approach is here described in which the deterioration of the resolving power as a function of specimen thickness is determined. In a manner similar to the Rayleigh criterion in which two image points are considered resolved at the resolution limit when their profiles overlap such that the minimum of one coincides with the maximum of the other, the resolution attainable in thick sections can be measured by the distance from minimum to maximum (or, equivalently, from 10% to 90% maximum) of the broadened profile of a well-defined step-like object placed on the specimen.

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