Quantification in low-energy ion scattering: elemental sensitivity factors and charge exchange processes

Author(s):  
S.N. Mikhailov ◽  
R.J.M. Elfrink ◽  
J.-P. Jacobs ◽  
L.C.A. van den Oetelaar ◽  
P.J. Scanlon ◽  
...  
2012 ◽  
Vol 101 (15) ◽  
pp. 151602 ◽  
Author(s):  
H. Téllez ◽  
R. J. Chater ◽  
S. Fearn ◽  
E. Symianakis ◽  
H. H. Brongersma ◽  
...  

Author(s):  
H.H. Brongersma ◽  
M. Carrere-Fontaine ◽  
R. Cortenraad ◽  
A.W. Denier van der Gon ◽  
P.J. Scanlon ◽  
...  

1994 ◽  
Vol 317 (3) ◽  
pp. 341-352 ◽  
Author(s):  
S.H. Overbury ◽  
R.J.A. van den Oetelaar ◽  
D.R. Mullins

1972 ◽  
Vol 30 (1) ◽  
pp. 69-90 ◽  
Author(s):  
D.J. Ball ◽  
T.M. Buck ◽  
D. Macnair ◽  
G.H. Wheatley

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