Processes with new better than used first-passage times

1984 ◽  
Vol 16 (03) ◽  
pp. 667-686 ◽  
Author(s):  
J. G. Shanthikumar

Let with Z(0) = 0 be a random process under investigation and N be a point process associated with Z. Both Z and N are defined on the same probability space. Let with R 0 = 0 denote the consecutive positions of points of N on the half-line . In this paper we present sufficient conditions under which (Z, R) is a new better than used (NBU) process and give several examples of NBU processes satisfying these conditions. In particular we consider the processes in which N is a renewal and a general point process. The NBU property of some semi-Markov processes is also presented.

1984 ◽  
Vol 16 (3) ◽  
pp. 667-686 ◽  
Author(s):  
J. G. Shanthikumar

Let with Z(0) = 0 be a random process under investigation and N be a point process associated with Z. Both Z and N are defined on the same probability space. Let with R0 = 0 denote the consecutive positions of points of N on the half-line . In this paper we present sufficient conditions under which (Z, R) is a new better than used (NBU) process and give several examples of NBU processes satisfying these conditions. In particular we consider the processes in which N is a renewal and a general point process. The NBU property of some semi-Markov processes is also presented.


1992 ◽  
Vol 29 (01) ◽  
pp. 116-128 ◽  
Author(s):  
C. Y. Teresa Lam

In this paper, we study the new better than used in expectation (NBUE) and new worse than used in expectation (NWUE) properties of Markov renewal processes. We show that a Markov renewal process belongs to a more general class of stochastic processes encountered in reliability or maintenance applications. We present sufficient conditions such that the first-passage times of these processes are new better than used in expectation. The results are applied to the study of shock and repair models, random repair time processes, inventory, and queueing models.


1992 ◽  
Vol 29 (1) ◽  
pp. 116-128 ◽  
Author(s):  
C. Y. Teresa Lam

In this paper, we study the new better than used in expectation (NBUE) and new worse than used in expectation (NWUE) properties of Markov renewal processes. We show that a Markov renewal process belongs to a more general class of stochastic processes encountered in reliability or maintenance applications. We present sufficient conditions such that the first-passage times of these processes are new better than used in expectation. The results are applied to the study of shock and repair models, random repair time processes, inventory, and queueing models.


2002 ◽  
Vol 34 (01) ◽  
pp. 241-259
Author(s):  
Félix Belzunce ◽  
Eva-María Ortega ◽  
José M. Ruiz

The purpose of this paper is to study ageing properties of first-passage times of increasing Markov chains. We extend the literature to some new ageing classes, such as the IFR(2), NBU(2), DRLLt and NBULt classes. We also give sufficient conditions in the finite case, that are more efficient computationally, just in terms of the transition matrix K, in the discrete case, or the generator matrix Q, in the continuous case. For the uniformizable, continuous-time Markov processes, we derive conditions in terms of the discrete uniformized Markov chain for the NBU(2) and the NBULt classes. In the last section, a review of the main results in this direction in the literature is given, and we compare some of the conditions stated in this paper with others given in the literature about some other ageing classes. Some examples where these results are applied are given.


2002 ◽  
Vol 34 (1) ◽  
pp. 241-259 ◽  
Author(s):  
Félix Belzunce ◽  
Eva-María Ortega ◽  
José M. Ruiz

The purpose of this paper is to study ageing properties of first-passage times of increasing Markov chains. We extend the literature to some new ageing classes, such as the IFR(2), NBU(2), DRLLt and NBULt classes. We also give sufficient conditions in the finite case, that are more efficient computationally, just in terms of the transition matrix K, in the discrete case, or the generator matrix Q, in the continuous case. For the uniformizable, continuous-time Markov processes, we derive conditions in terms of the discrete uniformized Markov chain for the NBU(2) and the NBULt classes. In the last section, a review of the main results in this direction in the literature is given, and we compare some of the conditions stated in this paper with others given in the literature about some other ageing classes. Some examples where these results are applied are given.


1988 ◽  
Vol 25 (04) ◽  
pp. 675-687 ◽  
Author(s):  
Ushio Sumita ◽  
Maria Rieders

A necessary and sufficient condition of Serfozo (1971) for lumpability of semi-Markov processes is reinterpreted in terms of first-exit times. Furthermore, a new necessary and sufficient condition is developed by establishing relationships between first-passage times and lumpability of semi-Markov processes. The approach taken in this paper is entirely based on the Laplace-transform domain.


1987 ◽  
Vol 1 (3) ◽  
pp. 279-291 ◽  
Author(s):  
Moshe Shaked ◽  
J. George Shanthikumar

An interpretation of log-concavity and log-convexity as aging notions is given in this paper. It imitates a stochastic ordering characterization of the NBU (new better than used) and the NWU (new worse than used) notions but stochastic ordering is now replaced by the likelihood ratio ordering. The new characterization of log-concavity and log-convexity sheds new light on these properties and enables one to obtain intuitively simple proofs of the log-convexity and log-concavity of some first passage times of interest in branching processes and in reliability theory.


1988 ◽  
Vol 25 (4) ◽  
pp. 675-687 ◽  
Author(s):  
Ushio Sumita ◽  
Maria Rieders

A necessary and sufficient condition of Serfozo (1971) for lumpability of semi-Markov processes is reinterpreted in terms of first-exit times. Furthermore, a new necessary and sufficient condition is developed by establishing relationships between first-passage times and lumpability of semi-Markov processes. The approach taken in this paper is entirely based on the Laplace-transform domain.


1985 ◽  
Vol 17 (2) ◽  
pp. 347-366 ◽  
Author(s):  
Ushio Sumita ◽  
J. George Shanthikumar

In this paper we define and analyze a class of cumulative shock models associated with a bivariate sequence {Xn, Yn}∞n=0 of correlated random variables. The {Xn} denote the sizes of the shocks and the {Yn} denote the times between successive shocks. The system fails when the cumulative magnitude of the shocks exceeds a prespecified level z. Two models, depending on whether the size of the nth shock is correlated with the length of the interval since the last shock or with the length of the succeeding interval until the next shock, are considered. Various transform results and asymptotic properties of the system failure time are obtained. Further, sufficient conditions are established under which system failure time is new better than used, new better than used in expectation, and harmonic new better than used in expectation.


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