Investigation on split-gate RSO MOSFET for 30 V breakdown

9th International Seminar on Power Semiconductors (ISPS 2008) ◽

10.1049/ic:20080224 ◽

2008 ◽

Cited By ~ 1

Author(s):

C.F. Tong ◽

P.A. Mawby ◽

J.A. Covington ◽

A. Perez-Tomas

Download Full-text