Data dependent jitter (DDJ) characterization methodology

20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) ◽

10.1109/dftvs.2005.25 ◽

2006 ◽

Cited By ~ 4

Author(s):

Kyung Ki Kim ◽

Yong-Bin Kim ◽

F. Lombardi