Breakdown transients in ultra-thin gate oxynitrides

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309982 ◽

2004 ◽

Author(s):

S. Lombardo ◽

F. Palumbo ◽

J.H. Stathis ◽

B.P. Linder ◽

K.L. Pey ◽

...

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