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2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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104
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Published By IEEE
0780385284
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Latest Documents
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Leakage-induced signal degradation in VLSI interconnection for buffered bus line & logic
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309892
◽
2005
◽
Author(s):
P. Aum
Keyword(s):
Signal Degradation
◽
Induced Signal
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Low-K cu damascene interconnection leakage and process induced damage assessment
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309966
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2005
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Author(s):
P. Aum
Keyword(s):
Damage Assessment
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Low K
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The Double-Gate FinFET: Device and Impact on IC Design Automation
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309929
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2005
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Author(s):
I. Aller
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J.G. Clabes
Keyword(s):
Design Automation
◽
Double Gate
◽
Ic Design
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Welcome from the ICICDT Conference Chair
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309884
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2005
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Author(s):
Thuy Dao
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Breakdown transients in ultra-thin gate oxynitrides
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309982
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2004
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Cited By ~ 1
Author(s):
S. Lombardo
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F. Palumbo
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J.H. Stathis
◽
B.P. Linder
◽
K.L. Pey
◽
...
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Build-in reliability analysis for circuit design in the nanometer technology era
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309946
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2004
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Cited By ~ 1
Author(s):
Zhihong Liu
◽
Weiquan Zhang
◽
Fuchen Mu
Keyword(s):
Reliability Analysis
◽
Circuit Design
◽
Nanometer Technology
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Challenges and opportunities in the semiconductor industry
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309889
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2004
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Author(s):
M.R. Polcari
Keyword(s):
Semiconductor Industry
◽
Challenges And Opportunities
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Fast/sub 14/ Technology: design technology for the automation of multi-gigahertz digital logic
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309937
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2004
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Cited By ~ 1
Author(s):
S. Horne
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D. Glowka
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S. McMahon
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P. Nixon
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M. Seningen
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...
Keyword(s):
Digital Logic
◽
Technology Design
◽
Design Technology
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Atmospheric neutron effects in advanced microelectronics, standards and applications
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309974
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2004
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Cited By ~ 5
Author(s):
J.-L. Leray
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J. Baggio
◽
V. Ferlet-Cavrois
◽
O. Flament
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An embedded silicon nanocrystal nonvolatile memory for the 90nm technology node operating at 6V
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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10.1109/icicdt.2004.1309900
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2004
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Cited By ~ 1
Author(s):
R. Muralidhar
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R.F. Steimle
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M. Sadd
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R. Rao
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C.T. Swift
◽
...
Keyword(s):
Nonvolatile Memory
◽
Silicon Nanocrystal
◽
Technology Node
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