Analysis of mechanical and electrical straining effects on TFRs — statistical bimodal conductance approach

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559351 ◽

2008 ◽

Author(s):

Z. Stanimirovic ◽

M. M. Jevtic ◽

I. Stanimirovic

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