2008 26th International Conference on Microelectronics
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TOTAL DOCUMENTS

154

(FIVE YEARS 0)

H-INDEX

8

(FIVE YEARS 0)

Published By IEEE

9781424418817

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Defects and relaxation during the negative bias temperature instability in PMOSFET

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559343 ◽

2008 ◽

Author(s):

C. Benard ◽

J-L. Ogier ◽

D. Goguenheim

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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A comprehensive review of thermoelectric technology, micro-electrical and power generation properties

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559288 ◽

2008 ◽

Author(s):

C.A. Gould ◽

N.Y.A. Shammas ◽

S. Grainger ◽

I. Taylor

Keyword(s):

Power Generation ◽

Comprehensive Review

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A dynamic temperature mapping system with a 320x256 pixels frame size and 100kHz sampling rate

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559299 ◽

2008 ◽

Author(s):

M. Riccio ◽

G. Breglio ◽

A. Irace ◽

P. Spirito

Keyword(s):

Sampling Rate ◽

Temperature Mapping ◽

Dynamic Temperature ◽

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Subthreshold performance of deep-submicrometer dual gate material p-MOSFET and CMOS circuits for ultra low power analog/mixed-signal applications

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559244 ◽

2008 ◽

Author(s):

Saurav Chakraborty ◽

Abhijit Mallik ◽

Chandan Kumar Sarkar

Keyword(s):

Low Power ◽

Cmos Circuits ◽

Ultra Low Power ◽

Mixed Signal ◽

Deep Submicrometer ◽

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Reliability acceleration model of stacked ZrO2-Al2O3-ZrO2 MIM capacitor with cylinder type

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559337 ◽

2008 ◽

Author(s):

Jae Yong Seo ◽

Jung Eun Seok ◽

Hyun Joo kim ◽

Hyun Jung Kim ◽

Hong Sik Park ◽

...

Keyword(s):

Acceleration Model

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Modeling of nanoscale GaN FET in a compact 2-D model with gate stack effects

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559265 ◽

2008 ◽

Author(s):

Rajesh K. Tyagi ◽

Anil Ahlawat ◽

Manoj Pandey ◽

Sujata Pandey

Keyword(s):

D Model ◽

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Diffusion furnace dopant activation matching through a ramped temperature idle

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559278 ◽

2008 ◽

Author(s):

Kevin Black

Keyword(s):

Dopant Activation

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Simultaneous data transfers over peripheral bus using CDMA technique

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559315 ◽

2008 ◽

Author(s):

Tatjana Nikolic ◽

Goran Djordjevic ◽

Mile Stojcev

Keyword(s):

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New approach in estimating the lifetime in NBT stressed P-channel power VDMOSFETs

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559357 ◽

2008 ◽

Author(s):

D. Dankovic ◽

I. Manic ◽

V. Davidovic ◽

S. Djoric-Veljkovic ◽

S. Golubovic ◽

...

Keyword(s):

New Approach ◽

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Analysis of mechanical and electrical straining effects on TFRs — statistical bimodal conductance approach

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559351 ◽

2008 ◽

Author(s):

Z. Stanimirovic ◽

M. M. Jevtic ◽

I. Stanimirovic

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