Spacing impact on MOSFET mismatch

2008 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2008.4509320 ◽

2008 ◽

Author(s):

A. Cathignol ◽

S. Mennillo ◽

S. Bordez ◽

L. Vendrame ◽

G. Ghibaudo

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