2008 IEEE International Conference on Microelectronic Test Structures
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9781424418008, 9781424418015
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An evaluation of test structures for measuring the contact resistance of 3-D bonded interconnects

2008 ◽  
Author(s):  
H. Lin ◽  
S. Smith ◽  
J. T. M. Stevenson ◽  
A. M. Gundlach ◽  
C. C. Dunare ◽  
...  
Keyword(s):  
Contact Resistance

Test circuit for measuring pulse widths of single-event transients causing soft errors

2008 ◽  
Author(s):  
Balaji Narasimham ◽  
Matthew J. Gadlage ◽  
Bharat L. Bhuva ◽  
Ronald D. Schrimpf ◽  
Lloyd W. Massengill ◽  
...  
Keyword(s):  
Soft Errors ◽  
Single Event ◽  
Single Event Transients ◽  
Test Circuit

scholarly journals Comb capacitor structures for measurement of post-processed layers

2008 ◽  
Author(s):  
D. Roy ◽  
J. H. Klootwijk ◽  
N. A. M. Verhaeghl ◽  
H. H. A. J. Roosen ◽  
R. A. M. Wolters

Mismatch characterization of a high precision resistor array test structure

2008 ◽  
Author(s):  
Weidong Tian ◽  
Philipp Steinmann ◽  
Eric Beach ◽  
Imran Khan ◽  
Praful Madhani
Keyword(s):  
High Precision ◽  
Test Structure

Test structure for characterising low voltage coplanar EWOD system

2008 ◽  
Author(s):  
Yifan Li ◽  
Mita Yoshio ◽  
Les Haworth ◽  
William Parkes ◽  
Masanori Kubota ◽  
...  
Keyword(s):  
Low Voltage ◽  
Test Structure

Test structure for characterizing metal thickness in damascene CMP technology

2008 ◽  
Author(s):  
Alain Toffoli ◽  
Sylvain Maitrejean ◽  
Jean Duport de Pontcharra ◽  
Francois de Crecy ◽  
David Bouchu ◽  
...  
Keyword(s):  
Test Structure ◽  
Metal Thickness

On-mask mismatch resistor structures for the characterisation of maskmaking capability

2008 ◽  
Author(s):  
S. Smith ◽  
A. Tsiamis ◽  
M. McCallumt ◽  
A. C. Hourdt ◽  
J. T. M. Stevenson ◽  
...  
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