2008 IEEE International Conference on Microelectronic Test Structures
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9781424418008, 9781424418015
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Test circuit for measuring pulse widths of single-event transients causing soft errors

2008 ◽  
Author(s):  
Balaji Narasimham ◽  
Matthew J. Gadlage ◽  
Bharat L. Bhuva ◽  
Ronald D. Schrimpf ◽  
Lloyd W. Massengill ◽  
...  
Keyword(s):  
Soft Errors ◽  
Single Event ◽  
Single Event Transients ◽  
Test Circuit

scholarly journals Comb capacitor structures for measurement of post-processed layers

2008 ◽  
Author(s):  
D. Roy ◽  
J. H. Klootwijk ◽  
N. A. M. Verhaeghl ◽  
H. H. A. J. Roosen ◽  
R. A. M. Wolters

Test structure for characterising low voltage coplanar EWOD system

2008 ◽  
Author(s):  
Yifan Li ◽  
Mita Yoshio ◽  
Les Haworth ◽  
William Parkes ◽  
Masanori Kubota ◽  
...  
Keyword(s):  
Low Voltage ◽  
Test Structure

Test structure for characterizing metal thickness in damascene CMP technology

2008 ◽  
Author(s):  
Alain Toffoli ◽  
Sylvain Maitrejean ◽  
Jean Duport de Pontcharra ◽  
Francois de Crecy ◽  
David Bouchu ◽  
...  
Keyword(s):  
Test Structure ◽  
Metal Thickness

Spacing impact on MOSFET mismatch

2008 ◽  
Author(s):  
A. Cathignol ◽  
S. Mennillo ◽  
S. Bordez ◽  
L. Vendrame ◽  
G. Ghibaudo
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