Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466861 ◽

2010 ◽

Author(s):

Y. Li ◽

Y. Q. Fu ◽

B. W. Flynn ◽

W. Parkes ◽

Y. Liu ◽

...

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