2010 International Conference on Microelectronic Test Structures (ICMTS)
Latest Publications

TOTAL DOCUMENTS

61

(FIVE YEARS 0)

H-INDEX

7

(FIVE YEARS 0)

Published By IEEE

9781424469123

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A test structure for statistical evaluation of pn junction leakage current based on CMOS image sensor technology

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466868 ◽

2010 ◽

Author(s):

Kenichi Abe ◽

Takafumi Fujisawa ◽

Hiroyoshi Suzuki ◽

Shunichi Watabe ◽

Rihito Kuroda ◽

...

Keyword(s):

Leakage Current ◽

Statistical Evaluation ◽

Cmos Image Sensor ◽

Image Sensor ◽

Test Structure ◽

Sensor Technology ◽

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Orientation dependence and asymmetry of subthreshold characteristics in CMOSFETs

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466854 ◽

2010 ◽

Author(s):

T. Matsuda ◽

Y. Matsumura ◽

H. Iwata ◽

T. Ohzone

Keyword(s):

Orientation Dependence

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Conference officials

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466877 ◽

2010 ◽

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Session 5: Circuit

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466846 ◽

2010 ◽

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Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466861 ◽

2010 ◽

Author(s):

Y. Li ◽

Y. Q. Fu ◽

B. W. Flynn ◽

W. Parkes ◽

Y. Liu ◽

...

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Title page

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466880 ◽

2010 ◽

Keyword(s):

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An embedded process monitor test chip architecture

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466842 ◽

2010 ◽

Author(s):

Sachin Idgunji ◽

Vikas Chandra ◽

Cezary Pietrzyk ◽

Imran Iqbal ◽

Rob Aitken ◽

...

Keyword(s):

Test Chip ◽

Embedded Process ◽

Process Monitor

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Session 3: Nano/MEMS

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466862 ◽

2010 ◽

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A Balanced-SeeSaw MEMS swing probe for vertical profilometry of deep micro structures

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466858 ◽

2010 ◽

Author(s):

Yoshio Mita ◽

Jean-Bernard Pourciel ◽

Masanori Kubota ◽

Shaojun Ma ◽

Satoshi Morishita ◽

...

Keyword(s):

Micro Structures

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Highly automated sequence for Phase Change Memory test structure characterization

2010 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2010.5466865 ◽

2010 ◽

Author(s):

A Toffoli ◽

A Fantini ◽

G Betti Beneventi ◽

L Perniola ◽

R Kies ◽

...

Keyword(s):

Phase Change ◽

Phase Change Memory ◽

Memory Test ◽

Test Structure ◽

Structure Characterization ◽

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