Syndrome signature in output compaction for VLSI BIST

Proceedings of 9th International Conference on VLSI Design ◽

10.1109/icvd.1996.489629 ◽

2002 ◽

Author(s):

S.R. Das ◽

N. Goel ◽

W.B. Jone ◽

A.R. Nayak

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