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Proceedings of 9th International Conference on VLSI Design
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TOTAL DOCUMENTS
96
(FIVE YEARS 0)
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8
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Published By IEEE
0818672285
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Science, Technology, and the Indian Society
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489443
◽
2005
◽
Author(s):
V.D. Agrawal
Keyword(s):
Indian Society
◽
Science Technology
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Parallel concurrent path-delay fault simulation using single-input change patterns
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489647
◽
2002
◽
Cited By ~ 4
Author(s):
M.A. Gharaybeh
◽
M.L. Bushnell
◽
V.D. Agrawal
Keyword(s):
Fault Simulation
◽
Path Delay
◽
Delay Fault
◽
Path Delay Fault
◽
Single Input
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Design tradeoffs in high speed multipliers and FIR filters
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489449
◽
2002
◽
Cited By ~ 1
Author(s):
C. Nagendra
◽
R.M. Owens
◽
M.J. Irwin
Keyword(s):
High Speed
◽
Fir Filters
◽
Design Tradeoffs
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Maximum power estimation for CMOS circuits using deterministic and statistic approaches
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489636
◽
2002
◽
Cited By ~ 13
Author(s):
Chuan-Yu Wang
◽
K. Roy
Keyword(s):
Power Estimation
◽
Maximum Power
◽
Cmos Circuits
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A novel BIST architecture with built-in self check
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489455
◽
2002
◽
Author(s):
M.F. Abdulla
◽
C.P. Ravikumar
◽
A. Kumar
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Node-covering based defect and fault tolerance methods for increased yield in FPGAs
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489489
◽
2002
◽
Cited By ~ 18
Author(s):
F. Hanchek
◽
S. Dutt
Keyword(s):
Fault Tolerance
◽
Node Covering
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Design for high-speed testability of stuck-at faults
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489454
◽
2002
◽
Author(s):
T.J. Chakraborty
◽
V.D. Agrawal
Keyword(s):
High Speed
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VaWiRAM: a variable width random access memory module
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489488
◽
2002
◽
Author(s):
L.K. John
Keyword(s):
Random Access
◽
Random Access Memory
◽
Access Memory
◽
Memory Module
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Syndrome signature in output compaction for VLSI BIST
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489629
◽
2002
◽
Author(s):
S.R. Das
◽
N. Goel
◽
W.B. Jone
◽
A.R. Nayak
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An efficient test generation technique for sequential circuits with repetitive sub-circuits
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489480
◽
2002
◽
Author(s):
D.R. Chakrabarti
◽
A. Jain
Keyword(s):
Test Generation
◽
Sequential Circuits
◽
Generation Technique
◽
Efficient Test
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