Guidelines for improving intermetallic reliability

IEEE/CPMT/SEMI 29th International Electronics Manufacturing Technology Symposium (IEEE Cat. No.04CH37585) ◽

10.1109/iemt.2004.1321655 ◽

2004 ◽

Author(s):

L. Levine ◽

M. Osborne ◽

F. Keller

Download Full-text