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Temperature Limits of Single and Composite Storage Layer with Different Thicknesses and Capping Materials for p-STT-MRAM Applications
2018 IEEE International Memory Workshop (IMW)
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10.1109/imw.2018.8388854
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2018
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Author(s):
Luc Tillie
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Jyotirmoy Chatterjee
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Ricardo Sousa
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Stephane Auffret
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Jude Guelfucci
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...
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