Frequency and recovery effects in high-κ BTI degradation

2009 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2009.5173404 ◽

2009 ◽

Author(s):

Stephen Ramey ◽

Chetan Prasad ◽

Marty Agostinelli ◽

Sangwoo Pae ◽

Steven Walstra ◽

...

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