Analysis of Transient HTRB Leakage in a SiC Field Ring Termination

2020 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps45951.2020.9129571 ◽

2020 ◽

Author(s):

R. R. Potera ◽

T. Witt ◽

Y. Zheng

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