2020 IEEE International Reliability Physics Symposium (IRPS)
Latest Publications

TOTAL DOCUMENTS

193
(FIVE YEARS 193)

H-INDEX

2
(FIVE YEARS 2)

Published By IEEE

9781728131993
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Non-Isothermal Simulations to Optimize SiC MOSFETs for Enhanced Short-Circuit Ruggedness

2020 ◽  
Author(s):  
Dongyoung Kim ◽  
Adam J Morgan ◽  
Nick Yun ◽  
Woongje Sung ◽  
Anant Agarwal ◽  
...  
Keyword(s):  
Short Circuit

Reliability Analysis by Charge Migration of 3D SONOS Flash Memory

2020 ◽  
Author(s):  
Jun-Kyo Jeong ◽  
Jae-Young Sung ◽  
Hee-Hun Yang ◽  
Hi-Deok Lee ◽  
Ga-Won Lee
Keyword(s):  
Reliability Analysis ◽  
Flash Memory ◽  
Charge Migration

Robust avalanche in GaN leading to record performance in avalanche photodiode

2020 ◽  
Author(s):  
Dong Ji ◽  
Burcu Ercan ◽  
Garret Benson ◽  
AKM Newaz ◽  
Srabanti Chowdhury
Keyword(s):  
Avalanche Photodiode

Inverse Design of FinFET SRAM Cells

2020 ◽  
Author(s):  
Rui Zhang ◽  
Zhaocheng Liu ◽  
Kexin Yang ◽  
Taizhi Liu ◽  
Wenshan Cai ◽  
...  
Keyword(s):  
Inverse Design

Superior Data Retention of Programmable Linear RAM (PLRAM) for Compute-in-Memory Application

2020 ◽  
Author(s):  
Shifan Gao ◽  
Yu Cong ◽  
Zeyu Zhang ◽  
Xiang Qiu ◽  
Choonghyun Lee ◽  
...  
Keyword(s):  
Data Retention

Reliability of 200mm E-mode GaN-on-Si Power HEMTs

2020 ◽  
Author(s):  
David C. Zhou ◽  
William Li ◽  
Jingyu Shen ◽  
Leilei Chen ◽  
Thomas Zhao ◽  
...  
Keyword(s):  
Gan On Si
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