Mechanism of dynamic NBTI of pMOSFETs

IEEE International Integrated Reliability Workshop Final Report, 2004 ◽

10.1109/irws.2004.1422751 ◽

2005 ◽

Author(s):

B. Zhu ◽

J.S. Suehle ◽

J.B. Bernstein ◽

Y. Chen

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