Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors

IEEE Journal of the Electron Devices Society ◽

10.1109/jeds.2022.3141756 ◽

2022 ◽

pp. 1-1

Author(s):

Cheng-Hung Wu ◽

Nicolor Ronchi ◽

Kuan-Chi Wang ◽

Yu-Yun Wang ◽

Sean McMitchell ◽

...

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