IEEE Journal of the Electron Devices Society
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scholarly journals Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors

2022 ◽  
pp. 1-1
Author(s):  
Cheng-Hung Wu ◽  
Nicolor Ronchi ◽  
Kuan-Chi Wang ◽  
Yu-Yun Wang ◽  
Sean McMitchell ◽  
...  

scholarly journals A Novel Program Suspend Scheme for Improving the Reliability of 3D NAND Flash Memory

2022 ◽  
pp. 1-1
Author(s):  
Zhichao Du ◽  
Zhipeng Dong ◽  
Kaikai You ◽  
Xinlei Jia ◽  
Ye Tian ◽  
...  
Keyword(s):  
Flash Memory ◽  
Nand Flash ◽  
Nand Flash Memory

scholarly journals Impact of die carrier on reliability of power LEDs

2021 ◽  
pp. 1-1
Author(s):  
Shusmitha Kyatam ◽  
Luis N. Alves ◽  
Stanislav Maslovski ◽  
Joana C. Mendes

scholarly journals Solid Phase Recrystallization in Arsenic Ion-Implanted Silicon-On-Insulator by Microsecond UV Laser Annealing

2021 ◽  
pp. 1-1
Author(s):  
Toshiyuki Tabata ◽  
Fabien Roze ◽  
Pablo Acosta Alba ◽  
Sebastien Halty ◽  
Pierre-Edouard Raynal ◽  
...  
Keyword(s):  
Laser Annealing ◽  
Solid Phase ◽  
Silicon On Insulator ◽  
Uv Laser ◽  
Phase Recrystallization ◽  
Ion Implanted
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