SEE and TID Results for a RadHard-by-Design 16Mbit SRAM with Embedded EDAC

2006 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2006.295481 ◽

2006 ◽

Author(s):

C. Hafer ◽

J. Mabra ◽

D. Slocum ◽

T. Farris ◽

A. Jordan

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