2006 IEEE Radiation Effects Data Workshop
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41
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Single Event Effects Sensitivity of the Q Series Advanced CMOS Technology

2006 ◽  
Author(s):  
R. Koga ◽  
J. George ◽  
P. Yu ◽  
S. Crain ◽  
M. Zakrzewski ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Single Event ◽  
Single Event Effects

Effects of Radiation on Commercial Power Devices

2006 ◽  
Author(s):  
Luis Selva ◽  
Heidi Becker ◽  
Rosa Chavez ◽  
Leif Scheick
Keyword(s):  
Power Devices ◽  
Effects Of Radiation

The Effects of Proton Irradiation on 90 nm Strained Si CMOS on SOI Devices

2006 ◽  
Author(s):  
Aravind Appaswamy ◽  
Bongim Jun ◽  
Ryan Diestelhorst ◽  
Gustavo Espinel ◽  
A.P. Prakash ◽  
...  
Keyword(s):  
Proton Irradiation ◽  
Strained Si ◽  
Soi Devices

Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35¿m Triple-Well Process

2006 ◽  
Author(s):  
Mary Hartwell ◽  
Kevin Ryan ◽  
Steve Netherton ◽  
Peter Milliken ◽  
David Kerwin
Keyword(s):  
Total Ionizing Dose

Compendia of Radiation Test Results of Integrated Circuits

2006 ◽  
Author(s):  
Phil Layton ◽  
Charlie Gilbert ◽  
Ed Patnaude ◽  
Gale Williamson ◽  
Larry Longden ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Test Results ◽  
Radiation Test

Proton Tolerance of InAs Based HEMT and DHBT Devices

2006 ◽  
Author(s):  
Steven Currie ◽  
Nathan Harff ◽  
Robert Pittelkow ◽  
Paul Marshall ◽  
Joshua Bergman ◽  
...  
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