SEU Testing of SiGe Bipolar and BiCMOS Circuits

2010 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2010.5619701 ◽

2010 ◽

Author(s):

David L. Hansen ◽

Anthony Le ◽

Kay Chesnut ◽

Eric Miller ◽

Steven Pong ◽

...

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