2010 IEEE Radiation Effects Data Workshop
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9781424484058
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

SEU Testing of SiGe Bipolar and BiCMOS Circuits

2010 ◽  
Author(s):  
David L. Hansen ◽  
Anthony Le ◽  
Kay Chesnut ◽  
Eric Miller ◽  
Steven Pong ◽  
...  

Commercially Designed and Manufactured SDRAM SEE Data

2010 ◽  
Author(s):  
Craig Hafer ◽  
Matthew Von Thun ◽  
Mike Leslie ◽  
Fred Sievert ◽  
Anthony Jordan

Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory

2010 ◽  
Author(s):  
Steven S. McClure ◽  
Gregory R. Allen ◽  
Farokh Irom ◽  
Leif Z. Scheick ◽  
Philippe C. Adell ◽  
...  
Keyword(s):  
Test Results ◽  
Single Event ◽  
Jet Propulsion ◽  
Single Event Effect ◽  
Jet Propulsion Laboratory

Single Event and Low Dose-Rate TID Effects in the DS16F95 RS-485 Transceiver

2010 ◽  
Author(s):  
Andrew T. Kelly ◽  
Patrick R. Fleming ◽  
Ronald D. Brown ◽  
Frankie Wong
Keyword(s):  
Dose Rate ◽  
Low Dose ◽  
Single Event ◽  
Low Dose Rate
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