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OFF Current Suppression by Gate-gontrolled Strain in The N-type GaAs Piezoelectric FinFETs
2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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10.1109/sispad.2019.8870452
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2019
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Author(s):
Yuxiong Long
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Jun Z. Huang
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Zhongming Wei
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Jun-Wei Luo
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Xiangwei Jiang
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